Handloomed fabrics recognition with deep learning

LB Mahanta, DR Mahanta, T Rahman… - Scientific Reports, 2024 - nature.com
Every nation treasures its handloom heritage, and in India, the handloom industry
safeguards cultural traditions, sustains millions of artisans, and preserves ancient weaving …

Comparative analysis of SVM and ANN classifiers for defective and non-defective fabric images classification

BS Anami, MC Elemmi - The Journal of The Textile Institute, 2022 - Taylor & Francis
The present work gives a comparative analysis of two different classifiers, namely, Support
Vector Machine (SVM) and Artificial Neural Network (ANN) to classify defective and non …

[PDF][PDF] Classifying Similarity and Defect Fabric Textures based on GLCM and Binary Pattern Schemes.

R Reddy, BE Reddy, EK Reddy - International Journal of Information …, 2013 - Citeseer
Textures are one of the basic features in visual searching, computational vision and also a
general property of any surface having ambiguity. This paper presents a texture …

Fabric Defect Detection Systems and Methods in India: A Comprehensive Review

D Patil, S Asra - 2024 International Conference on Emerging …, 2024 - ieeexplore.ieee.org
India's textile industry heavily relies on efficient fabric defect detection for maintaining
product quality and production efficiency. This review paper comprehensively analyzes …

Review on Design Generation, Defect Detection and Identification of Handloom Cloths Using Deep Learning

A Das, A Deka - International Conference on Soft Computing and …, 2023 - Springer
Traditional textile design known as “handloom design” entails manually weaving elaborate
patterns and designs onto a loom. This industry has made a substantial contribution to the …

[PDF][PDF] International Journal of Trend in Scientific Research and Development (IJTSRD)

S Roy, P Anantharaman - memory, 2018 - academia.edu
For an electronic product or chip if functional faul exist, then the product or chip is of no use.
Therefor if we take a cache memory, a secondary memory fo high-speed retrieval of data …

[PDF][PDF] Информационная технология для анализа подсистемы дефектов выращивания полупроводниковых кристаллов

ЛИ Дьяченко, ЕВ Минов, СЭ Остапов… - … і комп'ютерні …, 2015 - irbis-nbuv.gov.ua
Предложена новая информационная технология для обработки и анализа подсистемы
дефектов выращивания полупроводниковых кристаллов. На основании набора …

Software for optical recognition of micro-and nano-objects in solids and colloidal solutions

O Val, L Diachenko, E Minov, S Ostapov… - Twelfth International …, 2015 - spiedigitallibrary.org
This paper deals with the development of algorithms and software for optical recognition of
growing defects in the semiconductor crystals and metal nanoparticles in colloidal solutions …

[引用][C] An effective GLCM and binary pattern schemes based classification for rotation invariant fabric textures

ROK Reddy, BE Reddy, EK Reddy - International Journal of Computer Engineering …, 2014

[引用][C] International Journal of Information Engineering and Electronic Business (IJIEEB)

ROK Reddy, BE Reddy, EK Reddy