To support emerging applications in autonomous and semi-autonomous driving, next-
generation automotive systems will be equipped with an increasing number of …

The constantly growing amount of semiconductors in automotive systems increases the
number of possible defect mechanisms, and therefore raises also the effort to maintain a …

Marginal hardware introduces severe reliability threats throughout the life cycle of a system.
Although marginalities may not affect the functionality of a circuit immediately after …

Embodiments of a device and method are disclosed. In an embodiment, a network interface
device is disclosed. The device includes a network interface configured to provide an …

Logic Built-In Self-Test (LBIST) with stored deterministic patterns is supported by the major
CAD vendors and is gaining increasing attention, especially for safety-critical applications …

This survey introduces into the common practices, current challenges and advanced
techniques of high quality system level test and diagnosis. Specialized techniques and …

With the recent advancement in sensing and controller technologies architecture design of
an autonomous driving system becomes an important issue. Researchers have been …

Many semiconductor circuit wearout monitoring techniques have been developed for
different applications. This paper presents an overview of the prominent wearout monitoring …

Short time-to-market requires the semiconductor industry to produce high quality electronic
devices as efficiently as possible. The time constraint requires efficient test and diagnosis …

A self-test apparatus for use in an electronic system includes an inter-chip communication
bus, a plurality of circuit devices, circuitry including memory, and test controller circuitry. The …