Evidence of negative capacitance and capacitance modulation by light and mechanical stimuli in pt/zno/pt schottky junctions

R Joly, S Girod, N Adjeroud, P Grysan, J Polesel-Maris - Sensors, 2021 - mdpi.com
We report on the evidence of negative capacitance values in a system consisting of metal-
semiconductor-metal (MSM) structures, with Schottky junctions made of zinc oxide thin films …

Study of Gallium-Doped Zinc Oxide Thin Films Processed by Atomic Layer Deposition and RF Magnetron Sputtering for Transparent Antenna Applications

P Lunca-Popa, JB Chemin, N Adjeroud, V Kovacova… - ACS …, 2023 - ACS Publications
Gallium-doped zinc oxide (GZO) films were fabricated using RF magnetron sputtering and
atomic layer deposition (ALD). The latter ones demonstrate higher electrical conductivities …

Elucidating the growth mechanism of ZnO films by atomic layer deposition with oxygen gas via isotopic tracking

T Nguyen, N Valle, J Guillot, J Bour… - Journal of Materials …, 2021 - pubs.rsc.org
The growth process of zinc oxide (ZnO) thin films by atomic layer deposition (ALD)
accompanied by the presence of oxygen gas pulsing is investigated by means of the …