A method for measuring helium atom diffraction with micron-scale spatial resolution is demonstrated in a scanning helium microscope (SHeM) and applied to study a micron-scale …
In understanding the nature of contrast in the emerging field of neutral helium microscopy, it is important to identify if there is an atom–surface scattering distribution that can be expected …
Nanoscale thin film coatings and surface treatments are ubiquitous across industry, science, and engineering; imbuing specific functional or mechanical properties (such as corrosion …
R Flatabø, SD Eder, T Reisinger, G Bracco, P Baltzer… - Ultramicroscopy, 2024 - Elsevier
Neutral helium atom microscopy is a novel microscopy technique which offers strictly surface- sensitive, non-destructive imaging. Several experiments have been published in recent …
2D materials continue to be pivotal in the advancement of modern devices. Their optoelectronic, mechanical and thermal properties can be finely modulated using a variety of …
A scanning helium microscope typically utilises a thermal energy helium atom beam, with an energy and wavelength (¡ 100 meV,∼ 0.05 nm) particularly sensitive to surface structure. An …
Three-dimensional mapping of microscopic surface structures is important in many applications of technology and research, including areas as diverse as microfluidics, MEMS …
AS Palau, SD Eder, G Bracco, B Holst - arXiv preprint arXiv:2111.12582, 2021 - arxiv.org
Neutral helium atom microscopy, also referred to as scanning helium microscopy and commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging …
Scanning helium microscopy (SHeM) is an emerging technique that uses a beam of neutral atoms to image and analyse surfaces. The low energies (∼ 64 meV) and completely non …