[HTML][HTML] Neutral helium atom microscopy

AS Palau, SD Eder, G Bracco, B Holst - Ultramicroscopy, 2023 - Elsevier
Neutral helium atom microscopy, also referred to as scanning helium microscopy and
commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging …

2D helium atom diffraction from a microscopic spot

NA von Jeinsen, SM Lambrick, M Bergin, A Radić… - Physical Review Letters, 2023 - APS
A method for measuring helium atom diffraction with micron-scale spatial resolution is
demonstrated in a scanning helium microscope (SHeM) and applied to study a micron-scale …

Observation of diffuse scattering in scanning helium microscopy

SM Lambrick, M Bergin, DJ Ward, M Barr… - Physical Chemistry …, 2022 - pubs.rsc.org
In understanding the nature of contrast in the emerging field of neutral helium microscopy, it
is important to identify if there is an atom–surface scattering distribution that can be expected …

Sub-resolution contrast in neutral helium microscopy through facet scattering for quantitative imaging of nanoscale topographies on macroscopic surfaces

SD Eder, A Fahy, MG Barr, JR Manson, B Holst… - Nature …, 2023 - nature.com
Nanoscale thin film coatings and surface treatments are ubiquitous across industry, science,
and engineering; imbuing specific functional or mechanical properties (such as corrosion …

[HTML][HTML] Reflection imaging with a helium zone plate microscope

R Flatabø, SD Eder, T Reisinger, G Bracco, P Baltzer… - Ultramicroscopy, 2024 - Elsevier
Neutral helium atom microscopy is a novel microscopy technique which offers strictly surface-
sensitive, non-destructive imaging. Several experiments have been published in recent …

Defect density quantification in monolayer MoS2 using helium atom micro-diffraction

A Radic, N von Jeinsen, K Wang, Y Zhu, I Sami… - arXiv preprint arXiv …, 2024 - arxiv.org
2D materials continue to be pivotal in the advancement of modern devices. Their
optoelectronic, mechanical and thermal properties can be finely modulated using a variety of …

[HTML][HTML] Measuring scattering distributions in scanning helium microscopy

CJ Hatchwell, M Bergin, B Carr, MG Barr, A Fahy… - Ultramicroscopy, 2024 - Elsevier
A scanning helium microscope typically utilises a thermal energy helium atom beam, with an
energy and wavelength (¡ 100 meV,∼ 0.05 nm) particularly sensitive to surface structure. An …

True-to-size surface mapping with neutral helium atoms

SM Lambrick, A Salvador Palau, PE Hansen, G Bracco… - Physical Review A, 2021 - APS
Three-dimensional mapping of microscopic surface structures is important in many
applications of technology and research, including areas as diverse as microfluidics, MEMS …

Neutral Helium Microscopy (SHeM): A Review

AS Palau, SD Eder, G Bracco, B Holst - arXiv preprint arXiv:2111.12582, 2021 - arxiv.org
Neutral helium atom microscopy, also referred to as scanning helium microscopy and
commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging …

A multi-detector neutral helium atom microscope

C Zhao, SM Lambrick, NA von Jeinsen, Y Yuan… - Vacuum, 2025 - Elsevier
Scanning helium microscopy (SHeM) is an emerging technique that uses a beam of neutral
atoms to image and analyse surfaces. The low energies (∼ 64 meV) and completely non …