Electrostatic pull-in instability in MEMS/NEMS: A review

WM Zhang, H Yan, ZK Peng, G Meng - Sensors and Actuators A: Physical, 2014 - Elsevier
Pull-in instability as an inherently nonlinear and crucial effect continues to become
increasingly important for the design of electrostatic MEMS and NEMS devices and ever …

Capacitive RF MEMS switch dielectric charging and reliability: a critical review with recommendations

WM Van Spengen - Journal of Micromechanics and …, 2012 - iopscience.iop.org
This paper presents a comprehensive review of the reliability issues hampering capacitive
RF MEMS switches in their development toward commercialization. Dielectric charging and …

Research and analysis of MEMS switches in different frequency bands

W Tian, P Li, LX Yuan - Micromachines, 2018 - mdpi.com
Due to their high isolation, low insertion loss, high linearity, and low power consumption,
microelectromechanical systems (MEMS) switches have drawn much attention from …

Pull-in Instability Analysis of a Nanocantilever Based on the‎ Two-Phase Nonlocal Theory of Elasticity

G Mikhasev, E Radi, V Misnik - Journal of Applied and …, 2022 - iris.unimore.it
This paper deals with the pull-in instability of cantilever nano-switches subjected to
electrostatic and intermolecular forces in the framework of the two-phase nonlocal theory of …

Condition assessment and fault prognostics of microelectromechanical systems

K Medjaher, H Skima, N Zerhouni - Microelectronics Reliability, 2014 - Elsevier
Microelectromechanical systems (MEMS) are used in different applications such as
automotive, biomedical, aerospace and communication technologies. They create new …

A hybrid prognostics approach for MEMS: From real measurements to remaining useful life estimation

H Skima, K Medjaher, C Varnier, E Dedu… - Microelectronics …, 2016 - Elsevier
This paper presents a hybrid prognostics approach for Micro Electro Mechanical Systems
(MEMS). This approach relies on two phases: an offline phase for the MEMS and its …

Dielectric charge control in electrostatic MEMS positioners/varactors

E Blokhina, S Gorreta, D Lopez… - Journal of …, 2012 - ieeexplore.ieee.org
A new dynamical closed-loop method is proposed to control dielectric charging in capacitive
microelectromechanical systems (MEMS) positioners/varactors for enhanced reliability and …

Artifical neural networks in RF MEMS switch modelling

Z Marinković, V Marković, T Ćirić… - Facta universitatis …, 2016 - doiserbia.nb.rs
The increased growth of the applications of RF MEMS switches in modern communication
systems has created an increased need for their accurate and efficient models. Artificial …

Temperature as an accelerating factor for lifetime estimation of RF-MEMS switches

V Mulloni, L Lorenzelli, B Margesin, M Barbato… - Microelectronic …, 2016 - Elsevier
In satellite applications the devices have to retain their functionality for years and this
requirement necessitate of reliable methodologies to predict the switch lifetime. At present, a …

The effect of nano-scale interaction forces on the premature pull-in of real-life Micro-Electro-Mechanical Systems

R Ardito, A Frangi, A Corigliano, B De Masi… - Microelectronics …, 2012 - Elsevier
A new experimental device has been designed and produced with the purpose of
investigating the possible effect of nano-scale interaction forces on the reliability issue …