Ion bombardment energy distributions in a radio frequency induction plasma

J Hopwood - Applied physics letters, 1993 - pubs.aip.org
Ion bombardment energy distributions to a grounded substrate in a low pressure, rf induction
plasma source are measured. The plasma source consists of a planar, spiral coil driven at …

Slot antenna 2.45 GHz microwave plasma source

F Werner, D Korzec, J Engemann - Plasma Sources Science and …, 1994 - iopscience.iop.org
A new large-volume microwave plasma source of interest for technological applications has
been developed. An annular waveguide resonator with axial slots on its inner side acts as a …

Ion transport in an electron cyclotron resonance plasma

N Sadeghi, T Nakano, DJ Trevor… - Journal of applied …, 1991 - pubs.aip.org
Electron cyclotron resonance (ECR) plasma reactors are being developed for etching and
deposition of thin films during integrated circuit fabrication. To control critical parameters …

Microwave and plasma interaction in a rectangular waveguide: Effect of ponderomotive force

HK Malik, AK Aria - Journal of Applied Physics, 2010 - pubs.aip.org
Studies on the propagation of high power microwave and its interaction with a plasma in a
metallic waveguide are carried out. For this we consider the fundamental TE 10 mode that …

Density bunch formation by microwave in a plasma-filled cylindrical waveguide

HK Malik - Europhysics Letters, 2014 - iopscience.iop.org
We propose to employ the standing-wave pattern of TE mode in a cylindrical waveguide to
form the density bunches during the interaction of microwave and plasma. These bunches …

Single-wafer integrated semiconductor device processing

MM Moslehi, RA Chapman, M Wong… - IEEE transactions on …, 1992 - ieeexplore.ieee.org
The authors present an overview of various single-wafer fabrication techniques for
integrated processing of microelectronic devices. Numerous processing modules, sensors …

Kinetic-energy-enhanced neutral etching

SR Leone - Japanese journal of applied physics, 1995 - iopscience.iop.org
A review is presented of the emerging field of neutral-species kinetic-energy-enhanced
etching of silicon. As the gate oxide thickness of metal oxide semiconductor field-effect …

Characterization of a compact ECR plasma source and its applications to studies of helium ion damage to tungsten

D Donovan, D Buchenauer, J Whaley… - Physica Scripta, 2016 - iopscience.iop.org
Exposure of tungsten to low energy (< 100 eV) helium plasmas at temperatures between
900–1900 K in both laboratory experiments and tokamaks has been shown to cause severe …

Electron energy distributions in electron cyclotron resonance discharges for materials processing

Y Weng, MJ Kushner - Journal of applied physics, 1992 - pubs.aip.org
Electron cyclotron resonance (ECR) reactors are now being investigated for use in the
plasma processing of semiconductors. The attractive feature of ECR excitation is that high …

Plasma immersion ion implantation doping using a microwave multipolar bucket plasma

S Qin, NE McGruer, C Chan… - IEEE transactions on …, 1992 - ieeexplore.ieee.org
Using plasma immersion ion implantation, silicon has been doped with boron in a high-
voltage pulsed microwave multipolar bucket plasma system. Diborane gas (1%) diluted in …