Electrostatic discharge in semiconductor devices: protection techniques

JE Vinson, JJ Liou - Proceedings of the IEEE, 2000 - ieeexplore.ieee.org
Electrostatic discharges (ESDs) are everywhere-in our homes and businesses. Even the
manufacturers of the electronics experience ESD failures in their factories. Electronic …

NMOS triggered NMOS ESD protection circuit using low voltage NMOS transistors

BH Andresen, RA Cline - US Patent 6,310,379, 2001 - Google Patents
An integrated circuit is provided with electrostatic discharge (ESD) protection circuitry (120)
which uses low voltage transistors (N1, N2) to provide protection to a signal pad that …

Substrate pump NMOS for ESD protection applications

C Duvvury, S Ramaswamy… - … 2000 (IEEE Cat. No …, 2000 - ieeexplore.ieee.org
The use of a substrate pump to achieve uniform npn protection in a multi-finger NMOS is
reported for advanced CMOS technologies with silicide. The novel feature of this device …

[图书][B] ESD testing: from components to systems

SH Voldman - 2016 - books.google.com
With the evolution of semiconductor technology and global diversification of the
semiconductor business, testing of semiconductor devices to systems for electrostatic …

CMOS triggered NMOS ESD protection circuit

BH Andresen, RA Cline - US Patent 6,147,538, 2000 - Google Patents
An integrated circuit is provided With electrostatic discharge (ESD) protection circuitry (120)
A substrate region in the semiconductor substrate is enclosed by a ring of highly doped …

Layout extraction and verification methodology CMOS I/O circuits

T Li, SM Kang - Proceedings of the 35th annual Design Automation …, 1998 - dl.acm.org
This paper presents a layout extraction and verification methodology which targets reliability-
driven I/O design for CMOS VLSI chip, specifically to guard against electrostatic discharge …

Substrate resistance modeling and circuit-level simulation of parasitic device coupling effects for CMOS I/O circuits under ESD stress

T Li, CH Tsai, E Rosenbaum… - … Proceedings. 1998 (Cat …, 1998 - ieeexplore.ieee.org
In CMOS technologies, the layout and placement of devices and substrate contacts can
have significant impact on the circuit's ESD (electrostatic discharge) performance due to …

ESD protection device issues for IC designs

C Duvvury - Proceedings of the IEEE 2001 Custom Integrated …, 2001 - ieeexplore.ieee.org
Electrostatic discharge (ESD) has been a major concern for IC chip quality. In this paper, the
IC damage phenomena due to ESD and the protection techniques are reviewed. Also, the …

A substrate triggered lateral bipolar circuit for high voltage tolerant ESD protection applications

JC Smith - … Discharge Symposium Proceedings. 1998 (Cat. No …, 1998 - ieeexplore.ieee.org
In this work, a substrate triggered HV tolerant lateral NPN (LNPN) design is presented for a
fully salicided, 0.35/spl mu/m, 90/spl Aring/gate oxide, thin-epi, retrograde n-well, bulk …

[PDF][PDF] Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation

T Li, CH Tsai, E Rosenbaum, SM Kang - … of the 36th annual ACM/IEEE …, 1999 - dl.acm.org
Due to interactions through the common silicon substrate, the layout and placement of
devices and substrate contacts can have significant impacts on a circuit's ESD (Electrostatic …