Comparative Drop Shock Reliability Study of SAC-Based Alloys in BGA Assemblies

PP Vyas, A Alahmer, SS Alavi… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The reliability of SnAgCu (SAC)-based alloys has attracted considerable attention following
the restrictions on lead-based alloys in the electronics industry due to their toxic nature …

Drop shock testing analysis at elevated temperature: assessing SAC305 solder alloy reliability in BGA assemblies

PP Vyas, A Alahmer, S Bolanos… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The electronics industry is increasingly prioritizing the reliability of SnAgCu (SAC)-based
alloys due to environmental concerns related to lead-based alloys. Considering the frequent …

Product level design optimization for 2.5 D package pad cratering reliability during drop impact

H Wang, J Wang, J Xu, V Pham, K Pan… - 2019 IEEE 69th …, 2019 - ieeexplore.ieee.org
The conversion from using tin-lead solder joint to lead-free solder joint has raised many pad
cratering failures for electronics manufacturing. This phenomenon has become more severe …

Effects of 'Latent Damage'on pad cratering: Reduction in life and a potential change in failure mode

VA Raghavan, B Roggeman, M Meilunas… - Microelectronics …, 2013 - Elsevier
The transition of electronics manufacturing to lead-free soldering has led to the emergence
of pad cratering as an increasingly common failure mode. This first caused concern among …

Drop impact reliability of edge-bonded lead-free chip scale packages

A Farris, J Pan, A Liddicoat, M Krist, N Vickers… - Microelectronics …, 2009 - Elsevier
This paper presents the drop test reliability results for edge-bonded 0.5 mm pitch lead-free
chip scale packages (CSPs) on a standard JEDEC drop reliability test board. The test …

A COMPARATIVE STUDY OF THE THERMO-MECHANICAL BEHAVIOR OF WCSP ASSEMBLY DUE TO DIFFERENCE IN PCBS'LAYER THICKNESS

T Barua - 2016 - mavmatrix.uta.edu
Abstract The reliability of Chip Scale Package assembly is of great concern for the electronic
industry. Due to multiple function integration of the present devices there is a high demand …

[图书][B] Pad cratering: Development of a test protocol and quantification of the effects of 'latent damage'at the joint level and assembly level

VA Raghavan - 2010 - search.proquest.com
Lead-free transition in the electronics industry, owing to the Restriction of Hazardous
Substances (RoHS), has resulted in the use of laminates which are harder and more brittle …

Reliability of mixed alloy ball grid arrays using impact bend test and drop shock test

R Pandher, A Pachamuthu… - 2011 IEEE 61st Electronic …, 2011 - ieeexplore.ieee.org
Low-silver SnAgCu alloys are quickly becoming the standard Pb-free solders for portable
electronic devices. However, the industry's quick adoption of near-eutectic SnAgCu alloys …

Investigation of the Board Level Underfill with the Digital Image Correalation Technique–Thermal Fatigue

P VAN LAI - 2020 - search.proquest.com
The electronics package trend is toward miniaturization. To meet the demand for high
bandwidth chips and to reduce I/O latency and energy consumption, advanced packages …