M Hiroki, Y Taniyasu… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
We fabricated AlN metal semiconductor field effect transistors (MESFETs) with an epitaxially grown n-type AlN channel layer and characterized the temperature dependence of their …
H Elamen, Y Badali, M Ulusoy, Y Azizian-Kalandaragh… - Polymer Bulletin, 2024 - Springer
The RuO2-doped organic polymer composite structure was used as the interface to study the photodiode properties of a Schottky structure. Some basic electrical and optoelectrical …
J Kataoka, SL Tsai, T Hoshii… - Japanese Journal of …, 2021 - iopscience.iop.org
Leakage current analysis on 50 nm thick ferroelectric Al 0.78 Sc 0.22 N films with TiN electrodes has been performed. The electron conduction followed Schottky emission with an …
SL Tsai, T Hoshii, H Wakabayashi… - Japanese Journal of …, 2022 - iopscience.iop.org
The effects of field cycling of Al 0.78 Sc 0.22 N capacitors on ferroelectric properties are investigated. In the first hundreds of switching cycles, the reduction in the switching voltage …
The below bandgap optical transitions of an aluminum nitride (AlN) crystal grown on a tungsten (W) substrate by physical vapor transport (PVT) are investigated by below-bandgap …
ZY Qin, WL Li, ZH Sun, JH Ji, HL Wu, L Jin - Vacuum, 2023 - Elsevier
The residual thermal stress of AlN grown by the PVT method during the cooling process is investigated. Firstly, the stress at the AlN interface is evaluated by measuring Raman …
M Zhu, Y Ren, L Zhou, J Chen, H Guo, L Zhu… - Microelectronics …, 2021 - Elsevier
Temperature-dependent electrical characteristics were explicitly investigated for a 400-μm diameter neutron-irradiated (NI) GaN Schottky barrier diode (SBD). Based on CV …
H Guo, Z Zhang, Y Guo, Z Gao, R Zheng, H Wu - Applied Surface Science, 2020 - Elsevier
Schottky barrier heights (SBHs) at the Au/AlN interface are systemically studied by density functional calculations. Two types of interfaces, including Al-and N-polar interfaces, are …
Y Cao, Z Fan, Z Qin, L Jin, B Li, Z Sun, H Wu - APL Materials, 2023 - pubs.aip.org
Aluminum nitride (AlN) exhibits excellent high-temperature resistance, chemical stability, and a wide bandgap, making it a prime candidate material for deep ultraviolet detectors. In …