J He, G Tang, KJ Chen - IEEE Electron Device Letters, 2018 - ieeexplore.ieee.org
The impacts of static and dynamic gate stress on the threshold voltage () instability in Schottky-type-GaN gate AlGaN/GaN heterojunction field-effect transistors are experimentally …
The gate conduction mechanisms in p-gallium nitride (GaN)/AlGaN/GaN enhancement mode transistors are investigated using temperature-dependent dc gate current …
N Xu, R Hao, F Chen, X Zhang, H Zhang… - Applied Physics …, 2018 - pubs.aip.org
In this letter, gate leakage mechanisms in different gate contact normally off p- GaN/AlGaN/GaN high electron mobility transistors (HEMTs) have been studied by the …
S Yang, S Huang, J Wei, Z Zheng… - IEEE Electron …, 2020 - ieeexplore.ieee.org
In this work, the deep-level transient spectroscopy (DLTS) is conducted to investigate the gate stack of the p-GaN gate HEMT with Schottky gate contact. A metal/p-GaN/AlGaN/GaN …
J Wei, G Tang, R Xie, KJ Chen - Japanese Journal of Applied …, 2020 - iopscience.iop.org
GaN power ICs provide an elegant solution for high-frequency power switching applications. This paper will first discuss the GaN power integration platform, which requires not only a …
M Nuo, J Wei, M Wang, J Yang, Y Wu… - … on Electron Devices, 2022 - ieeexplore.ieee.org
To assess GaN power transistors' capability to maintain a decent E-mode operation, at high is measured for Schottky-type p-GaN gate HEMT, and an excessive negative shift is …
H Xu, J Wei, R Xie, Z Zheng, J He… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
The threshold voltage (VTH) of an enhancement-mode Schottky-type p-GaN gate high- electron-mobility transistor (HEMT) is found to have a special dependence on the drain bias …
Z Fan, M Wang, J Wei, M Nuo, J Zhou… - … on Power Electronics, 2023 - ieeexplore.ieee.org
To assess GaN power transistors' capability to maintain a decent enhancement-mode operation under high voltage switching operation, the impact of negative threshold voltage …
In this work, threshold voltage instability of normally off p-GaN high electron mobility transistors has been investigated by monitoring the gate current density during a device on …