Electrical properties and microstructure formation of V/Al-based n-contacts on high Al mole fraction n-AlGaN layers

L Sulmoni, F Mehnke, A Mogilatenko… - Photonics …, 2020 - opg.optica.org
Structural coloration techniques have improved display science due to their high durability in
terms of resistance to bleaching and abrasion, and low energy consumption. Here, we …

Electronic properties of Si-doped AlxGa1− xN with aluminum mole fractions above 80%

F Mehnke, XT Trinh, H Pingel, T Wernicke… - Journal of Applied …, 2016 - pubs.aip.org
The dependence of the activation energy as well as the energetic levels of the neutral
charge state and the DX center of the Si donor in Al x Ga 1− x N: Si samples on aluminum …

Influence of light absorption on the performance characteristics of UV LEDs with emission between 239 and 217 nm

F Mehnke, L Sulmoni, M Guttmann… - Applied Physics …, 2019 - iopscience.iop.org
The development of ultraviolet AlGaN multiple quantum well (MQW) light emitting diodes
(LEDs) in the wavelength range between 239 and 217 nm is presented. The effects of …

Deep UV emission from highly ordered AlGaN/AlN core–shell nanorods

PM Coulon, G Kusch, RW Martin… - ACS applied materials & …, 2018 - ACS Publications
Three-dimensional core–shell nanostructures could resolve key problems existing in
conventional planar deep UV light-emitting diode (LED) technology due to their high …

Electrical properties of (11-22) Si: AlGaN layers at high Al contents grown by metal-organic vapor phase epitaxy

HM Foronda, DA Hunter, M Pietsch, L Sulmoni… - Applied Physics …, 2020 - pubs.aip.org
In this work, the growth and conductivity of semipolar Al x Ga 1− x N: Si with (11-22)
orientation are investigated. Al x Ga 1− x N: Si (x= 0.60±0.03 and x= 0.80±0.02) layers were …

Electrical compensation and cation vacancies in Al rich Si-doped AlGaN

I Prozheev, F Mehnke, T Wernicke, M Kneissl… - Applied Physics …, 2020 - pubs.aip.org
We report positron annihilation results on vacancy defects in Si-doped Al0. 90Ga0. 10N
alloys grown by metalorganic vapor phase epitaxy. By combining room temperature and …

Tin gallium oxide epilayers on different substrates: optical and compositional analysis

DA Hunter, G Naresh‐Kumar, PR Edwards… - … status solidi (b), 2024 - Wiley Online Library
Electron beam techniques have been used to analyze the impact of substrate choice and
growth parameters on the compositional and optical properties of tin gallium oxide …

Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics

C Kuhn, M Martens, F Mehnke, J Enslin… - Journal of Physics D …, 2018 - iopscience.iop.org
The waveguide strain and the surface morphologies of AlGaN-based laser heterostructures
emitting in the deep UV spectral range have been investigated. In particular, the impact of …

A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content

L Spasevski, G Kusch, P Pampili… - Journal of Physics D …, 2020 - iopscience.iop.org
With a view to supporting the development of ultra-violet light-emitting diodes and related
devices, the compositional, emission and morphology properties of Si-doped n-type Al x Ga …

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C Trager-Cowan, A Alasmari, W Avis… - Photonics …, 2019 - opg.optica.org
In this paper we describe the scanning electron microscopy techniques of electron
backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray …