Scanning ion conductance microscopy (SICM) is a powerful surface imaging tool used in the
electrolytic environment. Tip-enhanced Raman spectroscopy (TERS) can give more …

The nano scale motions of piezoelectric actuated nano-positioning systems are very
sensitive to operating tasks, external disturbances, as well as variations of system dynamics …

An atomic force microscopy generally adopts a raster scanning method to obtain the image
of the sample morphology. However, the raster method takes too much time on the base part …

Atomic force microscopy (AFM) is nowadays indispensable versatile scanning probe method
widely employed for fundamental and applied research in physics, chemistry, biology as …

To shorten the scanning time by focusing on the local scanning for such specimens as cells,
this article proposes an advanced scanning strategy based on autonomous exploration, so …

In this paper, we propose a finite-impulse-response (FIR)-based feedforward control
approach to mitigate the acoustic-caused probe vibration during atomic force microscope …

The atomic force microscope (AFM) has become a powerful tool in many fields. However,
environmental noise and other disturbances are very likely to cause the AFM probe to …

This paper presents a post-filtering approach to eliminate distortions in atomic force
microscope (AFM) images caused by acoustic noise from an unknown location. AFM …

A major challenge in atomic force microscopy is to reduce the scan duration while retaining
the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in …

Morphology analysis based on atomic force microscopy (AFM) imaging contributes to
understanding the characteristics of specimens more deeply. The preliminary and crucial …