The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in
several fields of research, such as surface science, materials engineering, biochemistry and …

A general introduction to surface and interfacial forces, perfectly combining theoretical
concepts, experimental techniques and practical applications. In this completely updated …

We have measured the contact angle of microsized and nanosized alkane droplets partially
wetting a model substrate using true noncontact atomic force microscopy. The large range of …

We report on a novel technique to nucleate nanometer-sized droplets on a solid substrate
and to image them with minimal perturbation by noncontact atomic force microscopy (NC …

The mechanism and geometry of force measurement with the atomic force microscope are
analyzed in detail. The effective spring constant to be used in force measurement is given in …

A method to determine the van der Waals forces from phase–distance curves recorded by
atomic force microscopy (AFM) in tapping mode is presented. The relationship between the …

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force
microscopy that probes the nonlinear tip–surface force by measurement of the mixing of …

We describe a novel measurement method to study the contact line of a droplet at nanoscale
level. The method is based on Total Internal Reflection Fluorescence Microscopy (TIRFM) …

Theoretical calculations and experimental measurements are used to show that hitherto
neglected inertial effects can be significant in computer-controlled surface force …