This paper reviews soft error rate (SER) mitigations with standard process modifications in
up-to-date commercial CMOS SRAMs and flip-flops. Acting in the front-end or middle-end …

In deep sub-micron ICs, growing amounts of on-die memory and scaling effects make
embedded memories increasingly vulnerable to reliability and yield problems. As scaling …

As the size of the SRAM cache and DRAM memory grows in servers and workstations,
cosmic-ray errors are becoming a major concern for systems designers and end users …

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering
sciences. Soft errors are by nature multiscale and multiphysics problems that combine not …

This article aims to provide a survey of modeling and simulation of single-event effects
(SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the …

Scaling transistor size to the scale of the nanometer coupled with reduction of supply voltage
has made SRAMs more vulnerable to soft errors than ever before. The vulnerability has …

There are numerous elaborate and comprehensive textbooks and guidelines on stroke.
However, busy clinicians are constantly bombarded with new knowledge for an infinite …

Characteristics of soft errors (SEs) in 90/130 nm CMOS circuits were comprehensively
investigated by high energy neutron-and alpha-accelerated tests. Process dependence on …

Sense amplifiers (SA) play a vital role in supporting the read performance of static random-
access memory (SRAM). Single ended SRAM has attracted importance due to low leakage …

We present the architecture and a detailed pre-fabrication analysis of a digital measurement
ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also …