G Dingemans, WMM Kessels - … of Vacuum Science & Technology A, 2012 - pubs.aip.org
The reduction in electronic recombination losses by the passivation of silicon surfaces is a critical enabler for high-efficiency solar cells. In 2006, aluminum oxide (Al 2 O 3) nanolayers …
Subthreshold leakage currents and threshold-voltage shifts due to total-ionizing-dose (TID) irradiation are reviewed briefly for highly scaled devices in emerging MOS technologies …
We performed hybrid functional calculations of native point defects and dangling bonds (DBs) in α-Al 2 O 3 to aid in the identification of charge-trap and fixed-charge centers in Al 2 …
A controlled field-effect passivation by a well-defined density of fixed charges is crucial for modern solar cell surface passivation schemes. Al2O3 nanolayers grown by atomic layer …
Amorphous aluminum oxide Al 2 O 3 (a-Al 2 O 3) layers grown by various deposition techniques contain a significant density of negative charges. In spite of several experimental …
G Dingemans, NM Terlinden, MA Verheijen… - Journal of Applied …, 2011 - pubs.aip.org
Al 2 O 3 synthesized by atomic layer deposition (ALD) on H-terminated Si (100) exhibits a very thin (∼ 1 nm) interfacial SiO x layer. At this interface, a high fixed negative charge …
K Deng, S Huang, X Wang, Q Jiang, H Yin, J Fan… - Applied Surface …, 2023 - Elsevier
Bulk trapping and its effects on threshold voltage hysteresis (ΔV TH) in Al 2 O 3/AlGaN/GaN metal–oxide-semiconductor high electron mobility transistors (MOS-HEMTs) have been …
An overview of the effects of border traps on device performance and reliability is presented for Si, Ge, SiGe, InGaAs, SiC, GaN, and carbon-based MOS devices that are subjected to …
With Al 2 O 3 passivation on the surface of Cu (In, Ga) Se 2, the integrated photoluminescence intensity can achieve two orders of magnitude enhancement due to the …