Exploring the performance of 3-D nanosheet FET in inversion and junctionless modes: Device and circuit-level analysis and comparison

VB Sreenivasulu, AK Neelam, SR Kola, J Singh… - IEEE …, 2023 - ieeexplore.ieee.org
In this article, the performance of 3-D nanosheet FET (NS-FET) in inversion (INV) and
junctionless (JL) modes is demonstrated and compared at both device and circuit levels. In …

Gate-all-around nanowire junctionless transistor-based hydrogen gas sensor

S Mokkapati, N Jaiswal, M Gupta… - IEEE Sensors …, 2019 - ieeexplore.ieee.org
This paper reports on the detection of hydrogen (H 2) gas by utilizing a gate-all-around
nanowire (NW) junctionless (JL) transistor as a sensor. The effects of temperature and …

Nanoscale thermal transport in vertical gate-all-around junctionless nanowire transistors—Part I: Experimental methods

C Mukherjee, H Rezgui, Y Wang… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this article, we present the first detailed experimental study of electrothermal effects in 3-D
vertical gate-all-around (GAA) junctionless nanowire transistors (JLNTs). In contrast with …

Achieving Zero‐Temperature Coefficient Point Behavior by Defect Passivation for Temperature‐Immune Organic Field‐Effect Transistors

J Qi, K Tie, Y Ma, Y Huang, W Gong, S Sun… - Advanced …, 2024 - Wiley Online Library
Organic field‐effect transistors (OFETs) have broad prospects in biomedical, sensor, and
aerospace applications. However, obtaining temperature‐immune OFETs is difficult …

A physically-based threshold voltage definition, extraction and analytical model for junctionless nanowire transistors

RD Trevisoli, RT Doria, M de Souza… - Solid-State Electronics, 2013 - Elsevier
This work proposes a physically-based definition for the threshold voltage, V TH, of
junctionless nanowire transistors and a methodology to extract it. The V TH is defined as the …

Revisiting the doping requirement for low power junctionless MOSFETs

MS Parihar, A Kranti - Semiconductor Science and Technology, 2014 - iopscience.iop.org
In this work, we revisit the requirement of higher channel doping (≥ 10 19 cm− 3) in
junctionless (JL) double gate MOSFETs. It is demonstrated that moderately doped (10 18 …

Evidence of trapping and electrothermal effects in vertical junctionless nanowire transistors

Y Wang, C Mukherjee, H Rezgui, M Deng, J Müller… - Solid-State …, 2024 - Elsevier
Understanding trap dynamics and formation of localized temperature hot-spots due to self-
heating is crucial for the design optimization of emerging vertical junctionless nanowire …

Substrate bias influence on the operation of junctionless nanowire transistors

R Trevisoli, RT Doria, M de Souza… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
The aim of this paper is to analyze the substrate bias influence on the operation of
junctionless nanowire transistors based on 3-D simulated and experimental results …

A junctionless silicon carbide transistor for harsh environment applications

RK Baruah, BK Mahajan, YP Chen, RP Paily - Journal of Electronic …, 2021 - Springer
Silicon carbide (SiC) is the material of choice for high-temperature, high-voltage, and other
harsh environment applications in high-energy physics, outer space, etc., because of its high …

Analysis of the electrical parameters of SOI junctionless nanowire transistors at high temperatures

TA Ribeiro, S Barraud… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
This work studies the effects of the temperature variation, from 300K to 500K, on the
electrical parameters of SOI n-type and p-type junctionless nanowire transistors. The …