Cantilever-based biosensors

C Ziegler - Analytical and bioanalytical chemistry, 2004 - Springer
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Vibrational modes in MEMS resonators

D Platz, U Schmid - Journal of Micromechanics and …, 2019 - iopscience.iop.org
Advances in microfabrication technology have enabled micromechanical systems (MEMS)
to become a core component in a manifold of applications. For many of these applications …

Resonant behaviors of a nonlinear cantilever beam with tip mass subject to an axial force and electrostatic excitation

P Kim, S Bae, J Seok - International Journal of Mechanical Sciences, 2012 - Elsevier
In this study, the primary, sub-and super-harmonic resonant behaviors of a cantilever beam-
type micro-scale device are analytically solved and examined. The device under study …

Characterization of epitaxial Pb (Zr, Ti) O3 thin films deposited by pulsed laser deposition on silicon cantilevers

MD Nguyen, H Nazeer, K Karakaya… - Journal of …, 2010 - iopscience.iop.org
This paper reports on the piezoelectric-microelectromechanical system micro-fabrication
process and the behavior of piezoelectric stacks actuated silicon cantilevers. All oxide layers …

Study on the tip-deflection of a piezoelectric bimorph cantilever in the static state

C Huang, YY Lin, TA Tang - Journal of micromechanics and …, 2004 - iopscience.iop.org
Bimorph-type bending actuators have been widely used in many applications as converters
of electric input to mechanical motion, or vice versa. In this paper a new piezoelectric model …

Nanoscale investigation of optical and electrical properties by dynamic-mode atomic force microscopy using a piezoelectric cantilever

N Satoh, K Kobayashi, S Watanabe… - Japanese journal of …, 2003 - iopscience.iop.org
We demonstrated a novel application of a microfabricated force-sensing cantilever with a
lead zirconate titanate (PZT) thin film as an integrated deflection sensor for a dynamic-mode …

Electrostatic force microscopy

M Nakamura, H Yamada - Roadmap of Scanning Probe Microscopy, 2007 - Springer
6 Electrostatic Force Microscopy Page 1 6 Electrostatic Force Microscopy Masakazu Nakamura
and Hirofumi Yamada Electrostatic force microscopy (EFM) is one of the SPM families which …

Development of a new generation of active AFM tools for applications in liquids

AS Rollier, D Jenkins, E Dogheche… - Journal of …, 2010 - iopscience.iop.org
Atomic force microscopy (AFM) is a powerful imaging tool with high-resolution imaging
capability. AFM probes consist of a very sharp tip at the end of a silicon cantilever that can …

Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy

M Ishii, B Hamilton, N Poolton - Journal of Applied Physics, 2008 - pubs.aip.org
We have observed the distribution of electron trapping centers on distorted carbon
nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial …

[引用][C] 铜铅合金的扫描开尔文探针显微镜研究

周强, 谢中, 王祝盈, 陈小林, 王岩国 - 电子显微学报, 2006