Generating variation-aware library data with efficient device mismatch characterization

J Liu, FP Taraporevala - US Patent 8,204,730, 2012 - Google Patents
In a method of generating variation-aware library data for statistical static timing analysis
(SSTA), a “synthetic” Gaussian variable can be used to represent all instances of one or …

Incorporating manufacturing process variation awareness in fast design optimization of nanoscale CMOS VCOs

SP Mohanty, E Kougianos - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
This paper proposes a novel fast and unified mixed-signal design methodology by
incorporating manufacturing process variation awareness in power, performance, and …

Comprehensive reliability-aware statistical timing analysis using a unified gate-delay model for microprocessors

T Liu, CC Chen, L Milor - IEEE Transactions on Emerging …, 2016 - ieeexplore.ieee.org
A framework is proposed to perform timing analysis of state-of-art microprocessors
considering the impact of process-voltage-temperature (PVT) variations and the aging effect …

The effect of random dopant fluctuations on logic timing at low voltage

R Rithe, S Chou, J Gu, A Wang, S Datla… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
In order to achieve ultra-low power (ULP), ICs are being designed for V DD≤ 0.5 V. At these
low voltages, random dopant fluctuations (RDFs) result in a stochastic component of logic …

Statistical static timing analysis in non-linear regions

DD Buss, A Wang, G Gammie, J Gu, RJ Rithe… - US Patent …, 2012 - Google Patents
(57) ABSTRACT A method is described for simulating the f-sigma timing path delay of an
integrated circuit design when local transistor variations determine the stochastic delay. This …

Logic drivers: A propagation delay modeling paradigm for statistical simulation of standard cell designs

M Olivieri, A Mastrandrea - IEEE Transactions on Very Large …, 2013 - ieeexplore.ieee.org
In nanoscale digital CMOS IC design, the large technology parameter variations have
boosted the interest in statistical performance analysis. As the huge execution time of SPICE …

Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines

T Liu, CC Chen, L Milor - Sixteenth International Symposium …, 2015 - ieeexplore.ieee.org
This paper proposes a methodology for standard cell characterization which contains three
models: an input capacitance model, a sensitivity model for variational resistive-capacitive …

Non-linear operating point statistical analysis for local variations in logic timing at low voltage

R Rithe, J Gu, A Wang, S Datla… - … , Automation & Test …, 2010 - ieeexplore.ieee.org
For CMOS feature size of 65 nm and below, local (or intra-die or within-die) variations in
transistor Vt contribute stochastic variation in logic delay that is a large percentage of the …

Multivariate adaptive regression splines in standard cell characterization for nanometer technology in semiconductor

T Liu - Chapter, 2018 - books.google.com
Multivariate adaptive regression splines (MARSP) is a nonparametric regression method. It
is an adaptive procedure which does not have any predetermined regression model. With …

Statistical static timing analysis flow for transistor level macros in a microprocessor

VS Nandakumar, D Newmark, Y Zhan… - … on Quality Electronic …, 2010 - ieeexplore.ieee.org
Process variations are of great concern in modern technologies. Early prediction of their
effects on the circuit performance and parametric yield is extremely useful. In today's …