Piezoresponse force microscopy (PFM) detects the local piezoelectric deformation of a
sample caused by an applied electric field from the tip of a scanning force microscope. PFM …

Understanding the nanoscale electrodynamic properties of a material at microwave
frequencies is of great interest for materials science, condensed matter physics, device …

We present dynamic force-microscopy experiments and first-principles simulations that
contribute to clarify the origin of atomic-scale contrast in Kelvin-probe force-microscopy …

The invention of scanning tunneling and atomic force probes revolutionized our
understanding of surfaces by providing real-space information about the geometric and …

An investigation of ultrahigh-density ferroelectric data storage based on scanning nonlinear
dielectric microscopy (SNDM) is described. To obtain fundamental knowledge of high …

We study the effect of the depolarization field on a domain wall structure near the surface of
a ferroelectric. Since in real situation bound and screening charges form an electric double …

Unlike ideal 180 ferroelectric walls that are a unit cell wide (∼ 0.5 nm)⁠, real walls in
ferroelectrics have been reported to be many nanometers wide (1–10 nm). Using scanning …

We report force mapping experiments on Si (111)-(7× 7) surfaces with adsorbed hydrogen,
using atomic force microscopy at room temperature supported by density functional theory …

The three-body nuclear and molecular resonances for 55 135 Cs+ 1 2 H+ 1 2 H, and 55 133
Cs+ 1 3 H+ 1 3 H systems are calculated in “cuboctahedron 55 135 Cs 1 2 H 2 46 A Pd 12 …

Scanning nonlinear dielectric microscopy (SNDM) can easily distinguish the dopant type
(PN) and has a wide dynamic range of sensitivity from low to high concentrations of dopants …