A 130 mV SRAM with expanded write and read margins for subthreshold applications

MF Chang, SW Chang, PW Chou… - IEEE Journal of Solid …, 2010 - ieeexplore.ieee.org
SRAM suffers read-disturb and write failures at a low supply voltage, especially at deep
subthreshold operation. This study proposes a 9T-SRAM cell with a data-aware-feedback …

Challenges and trends in low-power 3D die-stacked IC designs using RAM, memristor logic, and resistive memory (ReRAM)

MF Chang, PF Chiu, WC Wu… - 2011 9th IEEE …, 2011 - ieeexplore.ieee.org
Low power 3D-IC is well-suited to mobile systems; however, it poses a number of
challenges associated with thermal stress, particularly in designs with many stacked layers …

Approximate SRAMs with dynamic energy-quality management

F Frustaci, D Blaauw, D Sylvester… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
In this paper, approximate SRAMs are explored in the context of error-tolerant applications,
in which energy is saved at the cost of the occurrence of read/write errors (ie, signal quality …

A Differential Data-Aware Power-Supplied (DAP) 8T SRAM Cell With Expanded Write/Read Stabilities for Lower VDDmin Applications

MF Chang, JJ Wu, KT Chen, YC Chen… - IEEE Journal of Solid …, 2010 - ieeexplore.ieee.org
Due to global and local process variations, on-chip SRAM suffers failures at a low supply
voltage (VDD). This study proposes a differential data-aware power-supplied D 2 AP 8T …

Endurance-aware circuit designs of nonvolatile logic and nonvolatile SRAM using resistive memory (memristor) device

MF Chang, CH Chuang, MP Chen… - 17th Asia and south …, 2012 - ieeexplore.ieee.org
The use of low voltage circuits and power-off mode help to reduce the power consumption of
chips. Non-volatile logic (nvLogic) and nonvolatile SRAM (nvSRAM) enable a chip to …

Performance comparison of CNFET-and CMOS-based 6T SRAM cell in deep submicron

AK Kureshi, M Hasan - Microelectronics journal, 2009 - Elsevier
This paper presents a performance comparison of a carbon nanotube-based field effect
(CNFET)-and CMOS-based 6T SRAM cell at the 32nm technology node. HSPICE …

A leakage compensation design for low supply voltage SRAM

CC Wang, DS Wang, CH Liao… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
A leakage current compensation design for nanoscale SRAMs is proposed in this paper.
The proposed compensation design is composed of a leakage current sensor, which …

A 1.0 fJ energy/bit single‐ended 1 kb 6T SRAM implemented using 40 nm CMOS process

CC Wang, RGB Sangalang, IT Tseng… - IET Circuits, Devices …, 2023 - Wiley Online Library
An ultra‐low‐energy SRAM composed of single‐ended cells is demonstrated on silicon in
this investigation. More specifically, the supply voltages of cells are gated by wordline (WL) …

Design of a high performance CNFET 10T SRAM cell at 5nm technology node

Z Yang, M Yin, Y You, Z Li, X Liu… - IEICE Electronics …, 2023 - jstage.jst.go.jp
This article proposes a CNFET 10T SRAM cell based on Stanford Virtual Source model at 5
nm technology node, through optimization design and simulation analysis to select optimum …

Improved read noise margin characteristics for single bit line SRAM cell using adiabatically operated word line

A Manna, VSK Bhaaskaran - 2017 International Conference on …, 2017 - ieeexplore.ieee.org
Background/Objectives: In the contemporary era, due to the rapid development in various
low power VLSI circuits, the primary factors that affect the performance of the circuits are …