Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Efficient mining of high utility itemsets has become one of the most interesting data mining
tasks with broad applications. In this paper, we proposed two efficient one-pass algorithms …

Increasing levels of integration and high speeds of operation have made the problem of
testing complex systems-on-packages (SOPs) very difficult. Testing packages with …

We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based
on an assemblage of learning machines that are trained beforehand to guide us through …

A method of testing for parametric faults of analog circuits based on a polynomial
representation of fault-free function of the circuit is presented. The response of the circuit …

In this paper, we present a parametric fault diagnosis approach for analog/RF circuits based
on a Bayesian framework. The Bayesian fault diagnosis requires extensive statistical …

Test time and test complexity reduction has become a critical challenge in modern RF
testing. Prior “alternative” test methods have achieved fast testing at the cost of using …

DC testing of parametric faults in non-linear analog circuits based on polynomial
approximation of the functionality of fault free circuit is presented. Classification of circuit …

A method for diagnosing process parameter variations from measurements in analog
circuits. The diagnosability conditions for the accurate computation of device parameters are …

In some methods for test generation, an analog device under test (DUT) is treated as a
discrete-time digital system by placing it between a digital-to-analog converter and an …