Recent Advances in Fine Pitch Cu Pillar Bumps for Advanced Semiconductor Packaging

EC Noh, HW Lee, JW Yoon - Journal of the Microelectronics and …, 2023 - koreascience.kr
Recently, as the demand for high-performance computers and mobile products increases,
semiconductor packages are becoming high-integration and high-density. Therefore, in …

Effects of α-Fe2O3 Additions on Assembly Reliability of Electroplated Sn-Based Solder Cap on Cu Pillar Bump During Thermal Cycling

L Liu, X Zhao, P Chen, Y Liu, Y Wang, W Chen… - Journal of Electronic …, 2019 - Springer
Composite solder alloys reinforced by different nominal concentrations of α-Fe 2 O 3
nanoparticles are examined and the performance of corresponding copper (Cu) pillar …

Research on thermal-electric coupling effect of the copper pillar bump in the flip chip packaging

Z Fu, B Zhou, R Yao, X Li - 2016 17th International Conference …, 2016 - ieeexplore.ieee.org
In this study, a 3D copper pillar bumps model was established to investigate the reliability of
the interconnection under thermal-electric coupling. In order to ensure the accuracy of the …

Unusual morphological evolution of the Cu pillar/solder micro-joints during high-temperature annealing

HK Cheng, YJ Lin, HC Chang, KC Liu, YL Wang… - … Materials Transactions A, 2015 - Springer
The morphological evolution of Cu pillars capped with Sn-1.8 wt pct Ag solder during high-
temperature annealing was investigated. Two intermetallic compounds (Cu 6 Sn 5+ Cu 3 …

Simulations of Microelectronic Packaging Reliability

K Chiang - 2024 - hammer.purdue.edu
Microelectronic packaging plays a vital role in semiconductor devices. With Moore's Law
nearing its limits, packaging is gaining interest to overcome the challenge. Wire bonding and …

Enabling Low-Temperature Bonding in Advanced Packaging using Electrodeposited Indium

Y Qin, K Flajslik, B Sherzer, E Banelis… - 2016 IEEE 66th …, 2016 - ieeexplore.ieee.org
As the advancement of transistor nodes faces unprecedented challenges and work
continues to extend Moore's law at the back end of the line (BEOL), packaging has become …