Dataset Generation for Stuck-at-Fault Detection in Array Multiplier Circuit using Multi-fold Classification

C SaiSanjna, PS Jedar, MV Prathiksha… - 2024 15th …, 2024 - ieeexplore.ieee.org
Faults are the defects in circuits that are also referred to as unexpected scenarios occurring
in digital circuits. These give rise to errors or operations that result in unreliable outcomes …

Development of a fault injection methodology and fault coverage analysis for a safety-relevant block

A Paolino - 2023 - webthesis.biblio.polito.it
As electronic products become integral to daily life, their presence in safety-critical
automotive systems becomes pervasive. The International Standard Organization (ISO) …