Planar Gunn diodes based on doped GaN active layers with different geometries have been fabricated and characterized. Gunn oscillations have not been observed due to the …
In this work, we report on Monte Carlo simulations to study the capability to generate Gunn oscillations of diodes based on InP and GaN with around 1 μm active region length. We …
The wide bandgap material, Gallium Nitride (GaN), has emerged as the dominant semiconductor material to implement high-electron mobility transistors (HEMTs) that form the …
VN Sokolov, KW Kim, VA Kochelap… - Journal of Applied …, 2005 - pubs.aip.org
The conditions for microwave power generation with hot-electron transport are investigated in a submicron GaN diode when it operates in the limited space-charge accumulation (LSA) …
By means of Monte Carlo simulations of gallium nitride (GaN) planar Gunn diodes, the epilayer structure on which they are fabricated is optimized in order to achieve ultrahigh …
The performance and operation of GaN Gunn diodes has been investigated for a number of device structures and at various temperatures using a three-valley Monte Carlo model …
The existence of leakage current pathways leading to the appearance of impact ionization and the potential device breakdown in planar Gunn GaN diodes is analyzed by means of a …
The conditions for microwave power generation in a submicrometer GaN diode, with a relatively lightly doped active channel, coupled to an external resonant circuit are …
Impact ionization originated by the buffer leakage current, together with high electric fields (> 3 MV/cm) at the anode corner of the isolating trenches, has been identified as the failure …