Methods for fault tolerance in networks-on-chip

M Radetzki, C Feng, X Zhao, A Jantsch - ACM Computing Surveys …, 2013 - dl.acm.org
Networks-on-Chip constitute the interconnection architecture of future, massively parallel
multiprocessors that assemble hundreds to thousands of processing cores on a single chip …

Efficient DSP and circuit architectures for massive MIMO: State of the art and future directions

L Van der Perre, L Liu… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Massive MIMO is a compelling wireless access concept that relies on the use of an excess
number of base-station antennas, relative to the number of active terminals. This technology …

Analog Circuits and Signal Processing

M Ismail, M Sawan - 2013 - Springer
Today, micro-electronic circuits are undeniably and ubiquitously present in our society.
Transportation vehicles such as cars, trains, buses, and airplanes make abundant use of …

Demystifying surrogate modeling for circuits and systems

MB Yelten, T Zhu, S Koziel… - IEEE Circuits and …, 2012 - ieeexplore.ieee.org
In this article, grey-box and black-box surrogate modeling are described, with some key
findings. The important point is that surrogate modeling has a solid mathematical basis …

Compact MOSFET modeling for process variability-aware VLSI circuit design

SK Saha - IEEE access, 2014 - ieeexplore.ieee.org
This paper presents a systematic methodology to develop compact MOSFET models for
process variability-aware VLSI circuit design. Process variability in scaled CMOS …

Process variability in top-down fabrication of silicon nanowire-based biosensor arrays

M Tintelott, V Pachauri, S Ingebrandt, XT Vu - Sensors, 2021 - mdpi.com
Silicon nanowire field-effect transistors (SiNW-FET) have been studied as ultra-high
sensitive sensors for the detection of biomolecules, metal ions, gas molecules and as an …

[图书][B] Compact models for integrated circuit design: conventional transistors and beyond

SK Saha - 2015 - library.oapen.org
This modern treatise on compact models for circuit computer-aided design (CAD) presents
industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor …

[图书][B] FinFET devices for VLSI circuits and systems

SK Saha - 2020 - taylorfrancis.com
To surmount the continuous scaling challenges of MOSFET devices, FinFETs have emerged
as the real alternative for use as the next generation device for IC fabrication technology …

Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations

C Meinhardt, AL Zimpeck, RAL Reis - Microelectronics Reliability, 2014 - Elsevier
This work evaluates the impact on I ON and I OFF currents of variations in process
parameters for a set of predictive FinFET technologies from 20 nm to 7 nm. The main …

A 2.5 GHz Low Power, High- , Reliable Design of Active Bandpass Filter

V Kumar, R Mehra, A Islam - IEEE Transactions on Device and …, 2017 - ieeexplore.ieee.org
In this paper, a variation-aware and reliable design of a fully integrated radio frequency (RF)
bandpass filter realized using a voltage differencing transconductance amplifier is …