Addition of MgO nanoparticles and plasma surface treatment of three-dimensional printed polycaprolactone/hydroxyapatite scaffolds for improving bone regeneration

HS Roh, CM Lee, YH Hwang, MS Kook… - Materials Science and …, 2017 - Elsevier
Magnesium (Mg) plays an important role in the body in mediating cell-extracellular matrix
interactions and controlling bone apatite structure and density. Hydroxyapatite (HAp) has …

III–V/Ge channel MOS device technologies in nano CMOS era

S Takagi, R Zhang, J Suh, SH Kim… - Japanese Journal of …, 2015 - iopscience.iop.org
CMOS utilizing high-mobility III–V/Ge channels on Si substrates is expected to be one of the
promising devices for high-performance and low power advanced LSIs in the future …

In vitro study of 3D PLGA/n-HAp/β-TCP composite scaffolds with etched oxygen plasma surface modification in bone tissue engineering

HS Roh, SC Jung, MS Kook, BH Kim - Applied Surface Science, 2016 - Elsevier
Abstract Three-dimensional (3D) scaffolds have many advantageous properties for bone
tissue engineering application, due to its controllable properties such as pore size, structural …

New materials for post-Si computing: Ge and GeSn devices

S Gupta, X Gong, R Zhang, YC Yeo, S Takagi… - MRS …, 2014 - cambridge.org
As Si-transistor technology advances beyond the 10 nm node, the device research
community is increasingly looking into the possibility of replacing Si with novel, high mobility …

III-V/Ge MOS device technologies for low power integrated systems

S Takagi, M Noguchi, M Kim, SH Kim, CY Chang… - Solid-State …, 2016 - Elsevier
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of the
promising devices for high performance and low power integrated systems in the future …

Novel process integration flow of germanium-on-silicon FinFETs for low-power technologies

S Choudhary, M Yogesh, D Schwarz… - Journal of Vacuum …, 2023 - pubs.aip.org
Germanium channel FinFET transistors process integration on a silicon substrate is a
promising candidate to extend the complementary metal–oxide–semiconductor …

Physical Origins of High Normal Field Mobility Degradation in Ge p- and n-MOSFETs With GeOx/Ge MOS Interfaces Fabricated by Plasma Postoxidation

R Zhang, X Yu, M Takenaka… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Mechanisms of the mobility degradation in high normal field (or N) in Ge p-and n-metal-
oxide–semiconductor field-effect transistors (MOSFETs) with plasma postoxidation GeO …

The mechanism of improving germanium metal–oxide–semiconductor field-effect transistors' reliability by high-k dielectric and yttrium-doping: From the view of charge …

T Xiong, J Yang, HX Deng, Z Wei, YY Liu - Journal of Applied Physics, 2022 - pubs.aip.org
The application of germanium (Ge)-based transistors has long been restricted by the poor
reliability of the gate dielectrics. One solution proposed in the experiment is capping the …

Ge pMOSFETs with GeOx Passivation Formed by Ozone and Plasma Post Oxidation

Y Xu, G Han, H Liu, Y Wang, Y Liu, J Ao… - Nanoscale research …, 2019 - Springer
A comparison study on electrical performance of Ge pMOSFETs with a GeO x passivation
layer formed by ozone post oxidation (OPO) and plasma post oxidation (PPO) is performed …

Impact of Channel Orientation on Electrical Properties of Ge p- and n-MOSFETs With 1-nm EOT Al2O3/GeOx/Ge Gate-Stacks Fabricated by Plasma Postoxidation

R Zhang, X Yu, M Takenaka… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
The impact of surface orientations on electrical characteristics of Ge pand n-channel
MOSFETs with ultrathin equivalent oxide thickness Al 2 O 3/GeOx/Ge gate-stacks is …