Neutron radiation effects in high electron mobility transistors [AlGaAs/GaAs]

M Papastamatiou, N Arpatzanis… - … on Electron Devices, 2002 - ieeexplore.ieee.org
The effect of fast neutron radiation has been investigated in High Electron Mobility
Transistors (HEMT's). Devices with different layer structures have been employed for the …

Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exposed to high energy neutrons

BK Janousek, RJ Krantz, WL Bloss… - … on Nuclear Science, 1989 - ieeexplore.ieee.org
GaAs heterojunction field-effect transistors (HFETs) and inverters and ring oscillators
comprising HFETs have been exposed to neutron fluences of 5* 10/sup 13/n/cm/sup 2/to 1 …

The influence of Fermi-level pinning at the GaAs substrate on HEMT threshold voltage

RJ Krantz, DC Mayer, WL Bloss - Solid-state electronics, 1990 - Elsevier
A two-dimensional quantum well, strong-inversion model of threshold in AlGaAs/GaAs high-
electron-mobility transistors (HEMTs) has been extended to include the effects of Fermi-level …

Effect of non‐abrupt doping profiles on the carrier sheet density in one‐side modulation‐doped GaAs/AlGaAs quantum wells

FMS Lima, BG Enders, ALA Fonseca… - … status solidi (c), 2004 - Wiley Online Library
A theoretical study on the influence of non‐abrupt doping profiles on the electronic subband
structure in one‐side modulation‐doped GaAs/AlGaAs quantum wells with graded interfaces …

Neutron irradiation effects in high electron mobility transistors

B Jun, S Subramanian… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
Neutron irradiation effects on the IV characteristics of AlGaAs-GaAs high electron mobility
transistors and AlGaAs-InGaAs heterostructure insulated gate field-effect transistors are …

[图书][B] Modulation doped field-effect photodetectors

MA Romero - 1995 - search.proquest.com
The dissertation is concerned with the modeling and characterization of MODFETs
(Modulation Doped Field-Effect Transistors) as photodetectors. Analytical derivation …

Degraded model of radiation-induced acceptor defects for GaN-based high electron mobility transistors (HEMTs)

F Long, H Yue, Z Yuan-Fu, Z Jin-Cheng… - Chinese …, 2009 - iopscience.iop.org
Using depletion approximation theory and introducing acceptor defects which can
characterize radiation induced deep-level defects in AlGaN/GaN heterostructures, we set up …

The role of acceptor density on the high channel carrier density I–V characteristics of AlGaAs/GaAs MODFETs

RJ Krantz, WL Bloss - Solid-state electronics, 1990 - Elsevier
A triangular-well, one-subband, depletion layer model has been developed for the high
density region of a MODFET. The high density operation is defined as when the channel …

Subthreshold IV characteristics of AlGaAs/GaAs MODFETs: the role of unintentional acceptors

RJ Krantz, WL Bloss - IEEE transactions on electron devices, 1989 - ieeexplore.ieee.org
A strong-inversion depletion-layer model of threshold has been extended to describe
subthreshold IV characteristics in MODFETs. The results of this calculation yield the …

Effect of residual acceptors on electron mobility in single asymmetric quantum wells

FMS Lima, ALA Fonseca, OAC Nunes, F Qu… - Physica E: Low …, 2003 - Elsevier
We present the results of the calculation of the low-temperature electron mobility in one-side
modulation-doped single asymmetric quantum wells, taking into account the presence of …