Recent advances on electromigration in very-large-scale-integration of interconnects

KN Tu - Journal of applied physics, 2003 - pubs.aip.org
Today, the price of building a factory to produce submicron size electronic devices on 300
mm Si wafers is over billions of dollars. In processing a 300 mm Si wafer, over half of the …

Miniaturized single-crystalline fcc metals deformed in tension: New insights in size-dependent plasticity

G Dehm - Progress in Materials Science, 2009 - Elsevier
The continuing trend of miniaturizing materials in many modern technological applications
has led to a strong demand for understanding the complex mechanical properties of …

A dedicated superbend X-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

M Kunz, N Tamura, K Chen, AA MacDowell… - Review of Scientific …, 2009 - pubs.aip.org
A new facility for microdiffraction strain measurements and microfluorescence mapping has
been built on beamline 12.3. 2 at the advanced light source of the Lawrence Berkeley …

Manipulation of matter by electric and magnetic fields: Toward novel synthesis and processing routes of inorganic materials

O Guillon, C Elsässer, O Gutfleisch, J Janek… - Materials today, 2018 - Elsevier
The use of external electric and magnetic fields for the synthesis and processing of inorganic
materials such as metals and ceramics has seen renewed interest in recent years …

Failure mechanisms in flexible electronics

Z Zhao, H Fu, R Tang, B Zhang, Y Chen… - International Journal of …, 2023 - Taylor & Francis
The rapid evolution of flexible electronic devices promises to revolutionize numerous fields
by expanding the applications of smart devices. Nevertheless, despite this vast potential, the …

Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction

AS Budiman, WD Nix, N Tamura, BC Valek… - Applied Physics …, 2006 - pubs.aip.org
Plastic deformation was observed in damascene Cu interconnect test structures during an in
situ electromigration experiment and before the onset of visible microstructural damage …

Progress of in situ synchrotron X-ray diffraction studies on the mechanical behavior of materials at small scales

TW Cornelius, O Thomas - Progress in Materials Science, 2018 - Elsevier
In recent years, the mechanical behavior of low-dimensional materials has been attracting
lots of attention triggered both by the ongoing miniaturization and the extraordinary …

Characterization of ion beam irradiated 304 stainless steel utilizing nanoindentation and Laue microdiffraction

A Lupinacci, K Chen, Y Li, M Kunz, Z Jiao… - Journal of Nuclear …, 2015 - Elsevier
Characterizing irradiation damage in materials utilized in light water reactors is critical for
both material development and application reliability. Here we use both nanoindentation …

A comprehensive study of electromigration in pure Sn: Effects on crystallinity, microstructure, and electrical property

YH Liao, CH Chen, CL Liang, KL Lin, AT Wu - Acta Materialia, 2020 - Elsevier
The literature has accumulated plenty of interesting findings of electromigration-induced
phenomena in pure Sn. Most of the researches revealed the thermodynamically steady …

Tutorial on x-ray microLaue diffraction

GE Ice, JWL Pang - Materials Characterization, 2009 - Elsevier
MicroLaue diffraction combines the oldest x-ray diffraction method–Laue diffraction–with the
most modern x-ray sources, optics and detectors. The combination can resolve complex …