Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy

R Garcia, A San Paulo - Physical Review B, 1999 - APS
Attractive and repulsive tip-sample interaction regimes of a force microscope operated with
an amplitude modulation feedback were investigated as a function of tip-sample separation …

Alumina surfaces and interfaces under non-ultrahigh vacuum conditions

JA Kelber - Surface science reports, 2007 - Elsevier
This paper is a review of studies of the structures and reactivities of ordered alumina
surfaces under ultrahigh vacuum (UHV;< 10− 8 Torr), ambient (> 1 Torr), and intermediate …

Separation of interactions by noncontact force microscopy

M Guggisberg, M Bammerlin, C Loppacher, O Pfeiffer… - Physical review B, 2000 - APS
Quantitative measurements of frequency shift vs distance curves of ultrahigh-vacuum force
microscopy in a noncontact mode are presented. Different contributions from electrostatic …

Simultaneous measurement of force and tunneling current at room temperature

D Sawada, Y Sugimoto, K Morita, M Abe… - Applied Physics …, 2009 - pubs.aip.org
We have performed simultaneous scanning tunneling microscopy and atomic force
microscopy measurements in the dynamic mode using metal-coated Si cantilevers at room …

Simultaneous AFM and STM measurements on the surface

Y Sugimoto, Y Nakajima, D Sawada, K Morita… - Physical Review B …, 2010 - APS
We perform simultaneous atomic force microscopy (AFM) and scanning tunneling
microscopy (STM) measurements on the Si (111)-(7× 7) surface. AFM/STM constant height …

Electrostatic energy calculation for the interpretation of scanning probe microscopy experiments

LN Kantorovich, AI Livshits… - Journal of Physics …, 2000 - iopscience.iop.org
We discuss the correct expression for the classical electrostatic energy used while analysing
scanning probe microscopy (SPM) experiments if either a conducting tip or a substrate or …

[HTML][HTML] Role of image forces in non-contact scanning force microscope images of ionic surfaces

LN Kantorovich, AS Foster, AL Shluger, AM Stoneham - Surface Science, 2000 - Elsevier
We consider the effect of the image interaction on the force acting between tip and surface in
non-contact scanning force microscope experiments. This interaction is relevant when a …

Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials

A San Paulo, R Garcı́a - Surface science, 2001 - Elsevier
Numerical simulations were applied to investigate the motion of a tip interacting with a
compliant sample. The dependence of the amplitude, deformation, contact time and phase …

Gap dependence of the tip-sample capacitance

S Kurokawa, A Sakai - Journal of applied physics, 1998 - pubs.aip.org
The tip-sample capacitance has been studied in the nontunneling regime and the
capacitance-distance characteristics and its dependence on the tip geometry have been …

Dynamic force microscopy across steps on the Si (111)-(7× 7) surface

M Guggisberg, M Bammerlin, A Baratoff, R Lüthi… - Surface science, 2000 - Elsevier
Force microscopy in atomic resolution with an oscillating tip has been performed across
monatomic steps of the Si (111)-(7× 7) surface using the tunnelling current or frequency shift …