Fast, high-resolution, non-destructive and quantitative characterization methods are needed
to develop materials with tailored properties at the nanoscale or to understand the …

Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging
technique that provides chemical analysis and compositional mapping with spatial …

For the past 15 years, there has been tremendous interest and technological development
concerning biocomposites. Plant fibres can be derived from a multitude of natural agro …

Manipulating a crystalline material's configurational entropy through the introduction of
unique atomic species can produce novel materials with desirable mechanical and electrical …

Ferroelectric materials have remained one of the major focal points of condensed matter
physics and materials science for over 50 years. In the last 20 years, the development of …

The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …

Piezoresponse force microscopy (PFM) detects the local piezoelectric deformation of a
sample caused by an applied electric field from the tip of a scanning force microscope. PFM …

The effect of reduced size on the elastic properties measured on silver and lead nanowires
and on polypyrrole nanotubes with an outer diameter ranging between 30 and 250 nm is …

Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …