Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients

D Ma, SE Zeltmann, C Zhang, Z Baraissov… - arXiv preprint arXiv …, 2024 - arxiv.org
Precise alignment of the electron beam is critical for successful application of scanning
transmission electron microscopes (STEM) to understanding materials at atomic level …

Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope

D Ma, SE Zeltmann, C Zhang, Z Baraissov… - arXiv preprint arXiv …, 2024 - arxiv.org
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an
essential tool in understanding materials at the atomic scale. However, tuning the aberration …

Quantitative and Efficient Scanning Transmission Electron Microscopy with Machine Learning

J Wei - 2024 - search.proquest.com
Scanning transmission electron microscopy (STEM) has advanced the field of materials
science by enabling atomic-scale structural and functional imaging. Beyond standard 2D …