Light-stimulated artificial photonic synapses based on solution-processed In-Sn-Zn-O transistors for neuromorphic applications

J Kim, S Song, H Kim, G Yoo, SS Cho, J Kim… - Journal of Alloys and …, 2022 - Elsevier
Artificial photonic synapse devices (PSDs) hold great promise for the realization of next-
generation artificial vision systems and processing units through a synergistic combination …

Evaluation of positive-bias-stress-induced degradation in InSnZnO thin-film transistors by low frequency noise measurement

Z Jiang, M Zhang, S Deng, Y Yang… - IEEE Electron …, 2022 - ieeexplore.ieee.org
In this letter, degradation of InSnZnO thin-film transistors (TFTs) under positive bias stress
(PBS) is evaluated by low frequency noise (LFN) measurement for the first time. With PBS …

Enhanced electrical properties of amorphous In-Sn-Zn oxides through heterostructuring with Bi2Se3 topological insulators

CC Wang, AY Lo, MC Cheng, YS Chang, HC Shih… - Scientific Reports, 2024 - nature.com
Amorphous indium tin zinc oxide (a-ITZO)/Bi2Se3 nanoplatelets (NPs) were fabricated using
a two-step procedure. First, Bi2Se3 NPs were synthesized through thermal chemical vapor …

Low-frequency noise in hybrid-phase-microstructure ITO-stabilized ZnO thin-film transistors

Y Liu, S Deng, R Chen, B Li, YF En… - IEEE Electron Device …, 2017 - ieeexplore.ieee.org
Low-frequency noise (LFN) in hybrid-phase-microstructure ITO-stabilized ZnO thin-film
transistors is investigated. The measured drain current noise power spectral densities obey …

InSnZnO thin-film transistors with nitrogenous self-assembled multilayers passivation

Y Chen, B Li, W Zhong, G Li, L Lu… - … on Electron Devices, 2021 - ieeexplore.ieee.org
Nitrogenous octadecylamine (ODA) self-assembled multilayers (SAMs) are prepared as
passivation layers by the vapor-phase process for amorphous InSnZnO (ITZO) thin-film …

Impact of active layer thickness of nitrogen-doped In–Sn–Zn–O films on materials and thin film transistor performances

ZY Li, HZ Yang, SC Chen, YB Lu, YQ Xin… - Journal of Physics D …, 2018 - iopscience.iop.org
Nitrogen-doped indium tin zinc oxide (ITZO: N) thin film transistors (TFTs) were deposited on
SiO 2 (200 nm)/p-Si< 1 0 0> substrates by RF magnetron sputtering at room temperature …

Influence of sputtering power on the electrical properties of In-Sn-Zn oxide thin films deposited by high power impulse magnetron sputtering

ZY Li, SC Chen, QH Huo, MH Liao, MJ Dai, SS Lin… - Coatings, 2019 - mdpi.com
In-Sn-Zn oxide (ITZO) thin films have been studied as a potential material in flat panel
displays due to their high carrier concentration and high mobility. In the current work, ITZO …

Impact of photo-excitation on leakage current and negative bias instability in InSnZnO thickness-varied thin-film transistors

D Wang, M Furuta, S Tomai, K Yano - Nanomaterials, 2020 - mdpi.com
InSnZnO thin-film transistors (ITZO TFTs), having high carrier mobility, guarantee the
benefits of potential applications in the next generation of super-high-definition flat-panel …

Effect of Hydrogen on Long-Term Reliability of InZnO TFTs Characterized by Low-Frequency Noise

YY Chen, Y Liu, L Wang, B Li… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
The long-term reliability of InZnO (IZO) thin film transistors (TFTs) under a hydrogen-
containing environment is researched. Hydrogen incorporation induces hydroxyl groups and …

Long-Term Recovery Behavior in InSnZnO Thin-Film Transistors after Negative Bias Stress

Z Jiang, M Zhang, S Deng, M Wong… - 2023 IEEE International …, 2023 - ieeexplore.ieee.org
In this work, long-term recovery behavior in InSnZnO thin-film transistors (TFTs) after
negative bias stress (NBS) is systematically investigated for the first time. The on-state …