Properties of bare and thin-film-covered GaN (0001) surfaces

M Grodzicki - Coatings, 2021 - mdpi.com
In this paper, the surface properties of bare and film-covered gallium nitride (GaN) in wurtzite
form,(0001) oriented, are summarized. Thin films of several elements—manganese, nickel …

The impact of a recessed Δ-shaped gate in a vertical CAVET AlGaN/GaN MIS-HEMT for high-power low-loss switching applications

A Danielraj, S Deb, A Mohanbabu… - Journal of Computational …, 2022 - Springer
A Δ-shaped gate GaN-based E-mode vertical current-aperture vertical electron transistor
(CAVET) device with a boron-doped current block layer (B-CBL) on an n+ GaN substrate is …

Structural, Morphological, and Optical Characterization of GaN/p-Si Thin Films for Various Argon Flow Rates

A Mantarcı - JOM, 2020 - Springer
A thin film of gallium nitride (GaN) was successfully grown onto p-Si by a radio-frequency
(RF) magnetron sputter for different argon flows. X-ray diffraction (XRD) results proved that …

Bistable Fermi level pinning and surface photovoltage in GaN

M Grodzicki, K Moszak, D Hommel, GR Bell - Applied Surface Science, 2020 - Elsevier
Band bending and Fermi level pinning at GaN (0001) surfaces have proved controversial
despite their fundamental importance. By combining Kelvin probe, surface photovoltage and …

Power-dependent physical properties of thin films deposited on sapphire substrates by RF magnetron sputtering

A Mantarci, M Kundakçi - Bulletin of Materials Science, 2019 - Springer
Abstract Gallium nitride (GaN)(GaN) thin films were grown on the Al _ 2 O _ 3\left (0 0 0
1\right) Al 2 O 3 0001 substrate using radio frequency (RF) magnetron sputtering under …

Physical properties of RF magnetron sputtered GaN/n-Si thin film: impacts of RF power

A Mantarcı, M Kundakçi - Optical and Quantum Electronics, 2019 - Springer
GaN thin film was successfully produced on n-Si\left (100\right) nS i 100 substrate by RF
magnetron sputter under different RF power. Experimental measurement techniques such …

Fabrication of semi-polar (11-22) gan V-groove MOSFET using wet etching trench opening technique

Y Yin, J Pinchbeck, C O'Regan, I Guiney… - IEEE Electron …, 2022 - ieeexplore.ieee.org
In this letter, we report the fabrication of an enhancement-mode V-groove metal oxide
semiconductor field-effect transistor on semi-polar (11-22) GaN platform. A wet …

Influence of the epitaxial composition on N-face GaN KOH etch kinetics determined by ICP-OES

M Tautz, MT Kuchenbrod, J Hertkorn… - Beilstein Journal of …, 2020 - beilstein-journals.org
Roughening by anisotropic etching of N-face gallium nitride is the key aspect in today's
production of blue and white light emitting diodes (LEDs). Both surface area and number of …

Properties of thin film-covered GaN (0001) surfaces

M Grodzicki - Materials Proceedings, 2020 - mdpi.com
In this paper, the surface properties of bare and film-covered gallium nitride (GaN) of the
wurtzite form,(0001) oriented are summarized. Thin films of several elements—manganese …

A Study of the Photoelectrochemical Etching of n-GaN in H3PO4 and KOH Electrolytes

C Heffernan, RP Lynch… - ECS Journal of Solid State …, 2019 - iopscience.iop.org
We investigated the photoelectrochemical etching of n-GaN in H 3 PO 4 and KOH as a
function of electrolyte concentration, potential and light intensity. Etch rates measured by …