The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …

We report on radiation-induced soft error rate (SER) improvements in the 14-nm second
generation high-k+ metal gate bulk tri-gate technology. Upset rates of memory cells …

This paper investigates the impact of terrestrial radiation on soft error (SE) sensitivity along
the very large-scale integration (VLSI) roadmap of bulk, FDSOI and finFET nano-scale …

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering
sciences. Soft errors are by nature multiscale and multiphysics problems that combine not …

With the decrease of the device size, soft error induced by various particles becomes a
serious problem for advanced CMOS technologies. In this paper, we review the evolution of …

Soft error originating from cosmic ray is a serious concern for reliability demanding
applications, such as autonomous driving, supercomputer, and public transportation system …

We present experimental evidence of single-event upsets in 28 and 45 nm CMOS SRAMs
produced by single energetic electrons. Upsets are observed within 10% of nominal supply …

With the development of large-scale CMOS-integrated circuit manufacturing technology,
microprocessor chips are more vulnerable to soft errors and radiation interference, resulting …

Quantum computing is an up-and-coming technology that is expected to revolutionize the
computation paradigm in the next few years. Qubits, the primary computing elements of …

Abstract Systems and methods for implementing a lightweight checkpoint technique for
resilience against soft errors are disclosed. The technique provides effective, safe, and …