This is the author's second bibliography on process capability indices (PCIs) and contains
approximately 1080 journal papers and books for the period 2010–2021. The related …

A high production yield, Y= 1-p fail, and thus a low failure rate, p fail, is a key requirement for
successful chip design and the design of many other technical products and systems. We …

The current methods for estimating Process Capability Indices are based on the
assumptions of normality and accuracy of process data. Under actual production conditions …

8 Conclusion The study on the adoption of Internet of Things (IoT) technologies in India's
textile manufacturing sector is a critical examination of how digital transformation processes …

Osajulkaisut Osajulkaisut eivät sisälly väitöskirjan elektroniseen versioon. Leinonen, ME,
Destino, G., Kursu, O., Sonkki, M., & Pärssinen, A.(2018). 28 GHz Wireless Backhaul …

The concept of process capability has been widely used in production management and
quality control. However, applying traditional process capability evaluation method to …

Spa: El objetivo primordial del control estadístico de la calidad es evaluar la capacidad de
los procesos para cumplir consistentemente con las especificaciones de las características …

Different tolerances causes multiple values of machine capability index (Cmk) in the
traditional evaluation method of machine capability. On the basis of normal distribution, a …