Wafer map defect detection plays an important role in semiconductor manufacturing by
identifying root causes and accelerating process adjustments to ensure product quality and …

Wafer testing is crucial in semiconductor manufacturing. Accurate identification of wafer
defects enables precise localization of manufacturing issues, thereby enhancing chip …

A wafer bin map (WBM) represents the locational information of defective chips on the wafer.
The spatial correlation of defects on the wafer provides crucial information for the root cause …

Wafer bin maps (WBMs) data, presented as images, play a critical role in identifying defects
in the semiconductor industry. Thus, accurately classifying WBM defect patterns is essential …

Defect detection tasks of solid propellants (SPs), involving size, shape, and surface defects,
are essential for ensuring the quality of many industrial products. Developing separate …

As the deep learning algorithm, the long short-term memory (LSTM) network is an emerging
and hot tool to address classification issues. In the classification process, to provide more …

The detection of unknown defect patterns in wafer bin map (WBM) is crucial for maintaining
high production yields in semiconductor manufacturing. Existing methods often fail to handle …

In the semiconductor industry, wafer bin maps (WBMs) refer to image data that reveal the
defect of each chip positioned on that wafer. The WBMs provide crucial information that can …

This paper addresses the open set recognition (OSR) problem, where the goal is to correctly
classify samples of known classes while detecting unknown samples to reject. In the OSR …

When an unknown example, one that was not seen during training, appears, most
recognition systems usually produce overgeneralized results and determine that the …