Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Ferroelectric domain walls exhibit a range of interesting electrical properties and are now
widely recognized as functional 2D systems for the development of next‐generation …

The chemical conversion treatment for aluminium alloys based on the immersion in cerium
chloride/hydrogen peroxide solutions is one of the possible alternatives to the chromate …

Nowadays several measuring techniques, like SVET, SRET and Kelvin probe, exist to study
local potential differences on alloys surfaces. One very sensitive technique with good spatial …

Localized alternating current (ac) impedance measurements are acquired directly through a
conductive atomic force microscope (AFM) tip. Both a spectroscopy mode (where full …

Quantitative determination of the geometry of an atomic force microscope (AFM) probe tip is
critical for robust measurements of the nanoscale properties of surfaces, including accurate …

Nanoscale capacitance imaging with attofarad resolution (∼ 1 aF) of a nano-structured
oxide thin film, using ac current sensing atomic force microscopy, is reported. Capacitance …

The postsynthetic potential of the two-dimensional metal–organic framework Zr-bzpdc-MOF
which is based on the photoreactive molecule benzophenone-4, 4′-dicarboxylic acid …

Atomic force microscopy (AFM) has been an effective material removing tool for fabricating
various nanostructures because of its sub‐nanometer precision and simplicity in operation …