Physics, Structures, and Applications of Fluorite‐Structured Ferroelectric Tunnel Junctions

J Hwang, Y Goh, S Jeon - Small, 2024 - Wiley Online Library
The interest in ferroelectric tunnel junctions (FTJ) has been revitalized by the discovery of
ferroelectricity in fluorite‐structured oxides such as HfO2 and ZrO2. In terms of thickness …

Unveiled Ferroelectricity in Well‐Known Non‐Ferroelectric Materials and Their Semiconductor Applications

DH Lee, Y Lee, YH Cho, H Choi… - Advanced Functional …, 2023 - Wiley Online Library
Ferroelectric materials are considered ideal for emerging memory devices owing to their
characteristic remanent polarization, which can be switched by applying a sufficient electric …

Demonstration of 1 V Reliable FeRAM Operation: Vc Engineering Using Quasi-Chirality of Hf1–xZrxO2 in a Nanolaminate Structure

H Jang, A Kashir, T Schenk, M Habibi… - … applied materials & …, 2024 - ACS Publications
Hafnia thin films are known to demonstrate excellent performance with strong ferroelectricity
and high scalability, making them promising candidates for CMOS-compatible materials …

Investigation of Recovery Phenomena in Hf0.5Zr0.5O2-Based 1T1C FeRAM

J Okuno, T Yonai, T Kunihiro, Y Shuto… - IEEE Journal of the …, 2022 - ieeexplore.ieee.org
We have previously studied fatigue and its recovery phenomenon on 64 kbits hafnium-
based one-transistor and one-capacitor (1T1C) ferroelectric random-access memory …

Ferroelectric devices for content-addressable memory

M Tarkov, F Tikhonenko, V Popov, V Antonov… - Nanomaterials, 2022 - mdpi.com
In-memory computing is an attractive solution for reducing power consumption and memory
access latency cost by performing certain computations directly in memory without reading …

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications

L Grenouillet, J Barbot, J Laguerre… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
Ferroelectricity in doped HfO 2 thin films was reported for the first time 12 years ago,
generating strong interest in the non-volatile memory and logic community. Thanks to their …

Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM

D Ettisserry, A Visconti, M Bonanomi… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
NVDRAM is a 32Gb, dual layer 3D stacked, non-volatile (Hf, Zr) O 2-based 1T1C (1
Transistor 1 Capacitor) ferroelectric memory technology. With high capacity, low cost and …

Role of charge injection/de-trapping in imprint behavior of ferroelectric Hf0. 5Zr0. 5O2 thin film

Z Liu, K Toprasertpong, Z Cai, M Takenaka… - Applied Physics …, 2024 - pubs.aip.org
Ferroelectric HfO 2-based thin films have attracted increasing interest due to their potential
applications in nonvolatile memory areas. However, their unique properties, such as imprint …

Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance …

D Zhang, H Yang, Y Cao, Z Han, Y Liu, Q Wu, Y Han… - Micromachines, 2023 - mdpi.com
Hafnium-based ferroelectric memories are a promising approach to enhancing integrated
circuit performance, offering advantages such as miniaturization, compatibility with CMOS …

Dielectric breakdown behavior of ferroelectric HfO2 capacitors by constant voltage stress studied by in situ laser-based photoemission electron microscopy

Y Itoya, H Fujiwara, C Bareille, S Shin… - Japanese Journal of …, 2024 - iopscience.iop.org
In situ laser-based photoemission electron microscopy observations with time-dependent
dielectric breakdown measurements of TiN/Hf 0.5 Zr 0.5 O 2 (HZO)/TiN ferroelectric …