Patent Review on Laser Interference Lithography Technique for Producing Periodic Nanostructure

CW Jui, AJC Trappey, CC Fu - Recent Patents on …, 2018 - ingentaconnect.com
Background: Because line width has been close to atom size, for semiconductor industry,
except for achieving the target of line width, the cost will be more important. The mask-less …

System and methods of fluorescence microscope calibration

D Grunwald, M Huisman, C Smith - US Patent 11,392,016, 2022 - Google Patents
The described embodiments are directed to a system and methods of calibrating a
fluorescence microscope and/or light detection device using a calibrating apparatus. The …

Automated reader for gauge-based meters

M De Angeli - US Patent 11,118,942, 2021 - Google Patents
Mechanical gauges remain a common means to present values of a system or system
component to a user. Connect ing mechanical gauges to allow for notification messages to …