[HTML][HTML] Differential temperature sensors: Review of applications in the test and characterization of circuits, usage and design methodology

E Barajas, X Aragones, D Mateo, J Altet - Sensors, 2019 - mdpi.com
Differential temperature sensors can be placed in integrated circuits to extract a signature of
the power dissipated by the adjacent circuit blocks built in the same silicon die. This review …

Electrothermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor

M Onabajo, J Altet, E Aldrete-Vidrio… - … on Circuits and …, 2010 - ieeexplore.ieee.org
The focus in this paper is on the extraction of RF circuit performance characteristics from the
dc output of an on-chip temperature sensor. Any RF input signal can be applied to excite the …

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

E Aldrete-Vidrio, D Mateo, J Altet… - Measurement …, 2010 - iopscience.iop.org
This paper presents two approaches to characterize RF circuits with built-in differential
temperature measurements, namely the homodyne and heterodyne methods. Both non …

Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography

J León, X Perpiñà, J Altet, M Vellvehi… - Applied Physics Letters, 2013 - pubs.aip.org
This paper combines the infrared lock-in thermography (IR-LIT) and heterodyne excitation
techniques to detect high-frequency capacitive currents due to intradie electrical coupling …

Temperature sensors to measure the central frequency and 3 dB bandwidth in mmW power amplifiers

J Altet, D Mateo, D Gómez, JLG Jiménez… - IEEE microwave and …, 2014 - ieeexplore.ieee.org
This letter introduces a novel on-chip measurement technique for the determination of the
central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low …

Thermal issues in microelectronics

X Perpiñà, M Vellvehi, X Jordà - 2015 - books.rsc.org
Electronic systems are present in our everyday lives. In many applications, they have
complemented or replaced functions performed by other systems based on mechanic …

Wireless pad-free integrated circuit debugging by powering modulation and lock-in infrared sensing

J León, X Perpiñà, M Vellvehi, A Baldi… - Applied Physics …, 2013 - pubs.aip.org
In this work, non-functional radio frequency identification pad-free chips are analyzed by
modulating its powering scheme and noninvasively sensing their surface infrared (IR) …

Lock-in Infrared Thermography: A tool to locate and analyse failures in power devices

M Vellvehi, X Perpiñà, J León… - … on Electron Devices …, 2017 - ieeexplore.ieee.org
In this work, Lock-in Infrared Thermography (LIT) is presented as a powerful tool for failure
analysis in power devices. These devices are electrically characterized in the frequency …

[HTML][HTML] BPF-based thermal sensor circuit for on-chip testing of RF circuits

J Altet, E Barajas, D Mateo, A Billong, X Aragones… - Sensors, 2021 - mdpi.com
A new sensor topology meant to extract figures of merit of radio-frequency analog integrated
circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm …

Physically based analysis of electrical frequency response of passive microelectronic circuits by heterodyne lock-in thermal means

J León, X Perpiñà, J Altet, M Vellvehi… - Journal of Physics D …, 2013 - iopscience.iop.org
This paper combines the heterodyne modulation technique with lock-in detection
approaches to characterize the electrical behaviour of electronic systems in the frequency …