Impact of Hafnium Doping on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors

P Vishnumurthy, B Xu, F Wunderwald… - ACS Applied …, 2024 - ACS Publications
Zirconium oxide and zirconium-rich Zr x Hf1–x O2 thin films have attracted attention owing to
their switching stability and significant promise for commercial applications such as high …

Enhanced Switching Reliability of Hf0.5Zr0.5O2 Ferroelectric Films Induced by Interface Engineering

F Huang, B Saini, Z Yu, C Yoo, V Thampy… - … Applied Materials & …, 2023 - ACS Publications
Ferroelectric materials have been widely researched for applications in memory and energy
storage. Among these materials and benefiting from their excellent chemical compatibility …

Evidence for ferroelastic switching and nanoscopic domains in polycrystalline Si-doped hafnium oxide films

M Lederer, C Mart, T Kämpfe, D Lehninger… - Applied Physics …, 2023 - pubs.aip.org
The mechanism of nanoscopic domain switching in ferroelectric hafnium oxide and its
implications for antiferroelectric-like behavior as well as for the wake-up effect is still widely …

Effective Landau-type model of a -graphene nanostructure

AN Morozovska, MV Strikha, KP Kelley, SV Kalinin… - Physical Review …, 2023 - APS
To describe charge-polarization coupling in the nanostructure formed by a thin Hf x Zr 1− x O
2 film with single-layer graphene as the top electrode, we develop the “effective” Landau …

Impact of Electric Field Pulse Duration on Ferroelectric Hafnium Zirconium Oxide Thin Film Capacitor Endurance

MK Lenox, ST Jaszewski, SS Fields… - … status solidi (a), 2024 - Wiley Online Library
While ferroelectric HfO2 shows promise for use in memory technologies, limited endurance
is one factor that challenges its widespread application. Herein, endurance is investigated …

Electrode Elastic Modulus as the Dominant Factor in the Capping Effect in Ferroelectric Hafnium Zirconium Oxide Thin Films

MK Lenox, MR Islam, MSB Hoque… - … Applied Materials & …, 2024 - ACS Publications
The discovery of ferroelectricity in hafnia based thin films has catalyzed significant research
focused on understanding the ferroelectric property origins and means to increase stability …

Structural changes during wake-up and polarization switching in a ferroelectric Hf0. 5Zr0. 5O2 film

I Margolin, E Korostylev, E Kalika, D Negrov… - Acta Materialia, 2025 - Elsevier
Ferroelectric polycrystalline hafnium oxide films hold great promise for the electronics
industry, though an understanding of ferroelectricity in this unconventional material is still …

Reversible modulation of critical electric fields for a field-induced ferroelectric effect with field-cycling in ZrO 2 thin films

J Shin, DH Shin, K Do Kim, H Seo, KH Ye… - Journal of Materials …, 2024 - pubs.rsc.org
This study investigates the effects of field-cycling on the critical electric fields (Et→ PO and
EPO→ t) of the field-induced ferroelectric (FFE) effect in atomic layer deposited ZrO2 thin …

Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films

ST Jaszewski, SS Fields, S Calderon… - Advanced Electronic …, 2024 - Wiley Online Library
Biaxial stress is identified to play an important role in the polar orthorhombic phase stability
in hafnium oxide‐based ferroelectric thin films. However, the stress state during various …

Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films

L Shvilberg, C Zhou, MK Lenox, BL Aronson… - Applied Physics …, 2024 - pubs.aip.org
Oxygen diffusion coefficients in the metastable ferroelectric phase of polycrystalline hafnium
zirconium oxide (HZO) thin films have been quantified using 18 O tracers and time-of-flight …