Silicon MOS optoelectronic micro‐nano structure based on reverse‐biased PN junction

K Xu - physica status solidi (a), 2019 - Wiley Online Library
Photon emission from Si p‐channel MOS field‐effect transistor (PMOSFET) having 6‐μm
effective gate length that is operated as a three‐terminal gate‐controlled light‐emitting diode …

[图书][B] Smart CMOS image sensors and applications

J Ohta - 2020 - taylorfrancis.com
Revised and expanded for this new edition, Smart CMOS Image Sensors and Applications,
Second Edition is the only book available devoted to smart CMOS image sensors and …

Integrated silicon directly modulated light source using p-well in standard CMOS technology

K Xu - IEEE Sensors Journal, 2016 - ieeexplore.ieee.org
This paper studies integrated silicon light emitter implemented in standard CMOS
technologies. A new MOS-like structure utilizing deep p-well is presented, and compared …

Monolithically integrated Si gate-controlled light-emitting device: science and properties

K Xu - Journal of optics, 2018 - iopscience.iop.org
The motivation of this study is to develop ap–n junction based light emitting device, in which
the light emission is conventionally realized using reverse current driving, by voltage driving …

Light emission from silicon: Some perspectives and applications

AT Fiory, NM Ravindra - Journal of Electronic Materials, 2003 - Springer
Research on efficient light emission from silicon devices is moving toward leading-edge
advances in components for nano-optoelectronics and related areas. A silicon laser is being …

Si light-emitting device in integrated photonic CMOS ICs

K Xu, LW Snyman, H Aharoni - Optical Materials, 2017 - Elsevier
The motivation for integrated Si optoelectronics is the creation of low-cost photonics for mass-
market applications. Especially, the growing demand for sensitive biochemical sensors in …

Silicon LEDs fabricated in standard VLSI technology as components for all silicon monolithic integrated optoelectronic systems

M Du Plessis, H Aharoni… - IEEE Journal of Selected …, 2002 - ieeexplore.ieee.org
It is shown that, by using conventional VLSI design rules and device processing, a variety of
two terminal and multiterminal integrated silicon light-emitting devices (Si-LEDs) can be …

Temperature characteristics of hot electron electroluminescence in silicon

M Du Plessis, H Wen, E Bellotti - Optics Express, 2015 - opg.optica.org
Emission spectra of avalanching n^+ p junctions manufactured in a standard CMOS
technology with no process modifications were measured over a broad photon energy …

Photonic Transitions (1.4 eV–2.8 eV) in Silicon pnp Injection-Avalanche CMOS LEDs as Function of Depletion Layer Profiling and Defect Engineering

LW Snyman, M Du Plessis… - IEEE Journal of Quantum …, 2010 - ieeexplore.ieee.org
p+ np+ CMOS Si LED structures were modeled in order to investigate the effect of various
depletion layer profiles and defect engineering on the photonic transitions in the 1.4-2.8 eV …

Low-operating-voltage integrated silicon light-emitting devices

H Aharoni, M Du Plessis - IEEE journal of Quantum Electronics, 2004 - ieeexplore.ieee.org
A solution is presented for the fabrication of low-voltage, low-power (< 4.25 V and< 5 mW)
silicon light-emitting devices (Si-LEDs), utilizing standard very large scale integration …