[HTML][HTML] Optical wafer defect inspection at the 10 nm technology node and beyond

J Zhu, J Liu, T Xu, S Yuan, Z Zhang… - … Journal of Extreme …, 2022 - iopscience.iop.org
The growing demand for electronic devices, smart devices, and the Internet of Things
constitutes the primary driving force for marching down the path of decreased critical …

Integration of artificial intelligence in sustainable manufacturing: current status and future opportunities

R Agrawal, A Majumdar, A Kumar, S Luthra - Operations Management …, 2023 - Springer
Manufacturing firms often struggle to attain the optimum balance of environmental,
economic, and social goals. Sustainable Manufacturing (SM) is one of the ways to balance …

[PDF][PDF] 集成电路制造在线光学测量检测技术: 现状, 挑战与发展趋势

陈修国, 王才, 杨天娟, 刘佳敏, 罗成峰… - Laser & Optoelectronics …, 2022 - researching.cn
摘要在线测量检测技术与装备是保证集成电路(IC) 制造质量和良率的唯一有效技术手段, 在IC
制造过程中必须对IC 纳米结构的关键尺寸, 套刻误差, 以及缺陷等进行快速, 非破坏 …

Defect detection and classification in welding using deep learning and digital radiography

MM Naddaf-Sh, S Naddaf-Sh, H Zargarzadeh… - Fault diagnosis and …, 2021 - Elsevier
Continuous and digitized monitoring and automated inspection are key parts of modern
manufacturing and sustainment of aging infrastructure. The growing demand for these …

Machine learning techniques applied for the detection of nanoparticles on surfaces using coherent Fourier scatterometry

D Kolenov, SF Pereira - Optics Express, 2020 - opg.optica.org
We present an efficient machine learning framework for detection and classification of
nanoparticles on surfaces that are detected in the far-field with coherent Fourier …

Inspecting and classifying physical failures in MEMS substrates during fabrication using computer vision

S Raveendran, A Chandrasekhar - Microelectronic Engineering, 2022 - Elsevier
Visual inspection for defects has been predominantly used in all realms of the manufacturing
sector. MEMS substrates and circuits face multiple challenges during the fabrication phase …

CNN aided surface inspection for SMT manufacturing

MC Loo, R Logeswaran… - 2023 15th International …, 2023 - ieeexplore.ieee.org
Automated optical inspection (AOI) is a visual defect inspection system. The semiconductor
industry has a strong dependency on AOI for defects screening. Conventional AOI is …

Application of Convolutional Neural Network to TSOM Images for Classification of 6 nm Node Patterned Defects

R Attota - arXiv preprint arXiv:2211.12596, 2022 - arxiv.org
With the rapid growth in the semiconductor industry, it is becoming critical to detect and
classify increasingly smaller patterned defects. Recently machine learning, including deep …

Metrology

B Bunday, G Orji - … IEEE International Roadmap for Devices and …, 2021 - ieeexplore.ieee.org
The Metrology Chapter identifies emerging measurement challenges from devices, systems,
and integration of new materials in the semiconductor industry and describes research and …

Enhancing 6 nm CD Patterned Defect Classification with TSOM and CNNs

R Attota, A Anaya - 2023 34th Annual SEMI Advanced …, 2023 - ieeexplore.ieee.org
The rapid growth of the semiconductor industry has made it increasingly critical to detect and
classify increasingly smaller patterned defects with high certainty. Machine learning has …