Muonium states in semiconductors

BD Patterson - Reviews of Modern Physics, 1988 - APS
Positive muons implanted into diamond and zincblende-structured semiconductors often
form hydrogen-like paramagnetic muonium (μ+− e−) states whose characteristics can be …

Defects in silicon

RC Newman - Reports on Progress in Physics, 1982 - iopscience.iop.org
The method of obtaining pure polycrystalline silicon is described, followed by short accounts
of how this material is converted into single-crystal form either by the Czochralski (CZ) …

Transition metals in silicon

ER Weber - Applied Physics A, 1983 - Springer
A review is given on the diffusion, solubility and electrical activity of 3 d transition metals in
silicon. Transition elements (especially, Cr, Mn, Fe, Co, Ni, and Cu) diffuse interstitially and …

ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafers

PJ Caplan, EH Poindexter, BE Deal… - Journal of applied …, 1979 - pubs.aip.org
A definitive picture of the silicon/silicon dioxide interface and its associated electrical defect
centers continues to be an important goal of device research. t Electron spin resonance …

Intrinsic defects in silicon

GD Watkins - Materials science in semiconductor processing, 2000 - Elsevier
A review is given of what has been learned from electron paramagnetic resonance (EPR)
and localized vibrational mode (LVM) spectroscopy concerning isolated lattice vacancies …

29Si hyperfine structure of unpaired spins at the Si/SiO2 interface

KL Brower - Applied physics letters, 1983 - pubs.aip.org
The hyperfine spectrum associated with unpaired electrons at the (111) Si/Si02 interface (P
b centers) is reported for the first time. Electron paramagnetic resonance measurements …

Characterization of Si/SiO2 interface defects by electron spin resonance

EH Poindexter, PJ Caplan - Progress in surface science, 1983 - Elsevier
The defect structure of the Si/SiO 2 interface is increasingly important as the size of metal-
oxide-semiconductor (MOS) integrated circuits shrinks into the submicron regime. Extensive …

EPR studies of defects in electron-irradiated silicon: A triplet state of vacancy-oxygen complexes

YH Lee, JW Corbett - Physical Review B, 1976 - APS
Three new EPR spectra (Si− A 1 4,− A 1 5, and− A 16) and two previously known spectra (S
i− P 2 and− P 4) are observed for the first time in electron-irradiated silicon. The microscopic …

Subradiant bound dimer excited states of emitter chains coupled to a one dimensional waveguide

YX Zhang, C Yu, K Mølmer - Physical Review Research, 2020 - APS
This article shows that chains of optical or microwave emitters coupled to a one-dimensional
(1D) waveguide support subradiant states with close pairs of excited emitters, which have …

Deep-level nitrogen centers in laser-annealed ion-implanted silicon

KL Brower - Physical Review B, 1982 - APS
An electron-paramagnetic-resonance (EPR) study dealing with the means for introducing
substitutional N into silicon and the structure of N centers is presented in this paper. Nitrogen …