RC Newman - Reports on Progress in Physics, 1982 - iopscience.iop.org
The method of obtaining pure polycrystalline silicon is described, followed by short accounts of how this material is converted into single-crystal form either by the Czochralski (CZ) …
A review is given on the diffusion, solubility and electrical activity of 3 d transition metals in silicon. Transition elements (especially, Cr, Mn, Fe, Co, Ni, and Cu) diffuse interstitially and …
PJ Caplan, EH Poindexter, BE Deal… - Journal of applied …, 1979 - pubs.aip.org
A definitive picture of the silicon/silicon dioxide interface and its associated electrical defect centers continues to be an important goal of device research. t Electron spin resonance …
A review is given of what has been learned from electron paramagnetic resonance (EPR) and localized vibrational mode (LVM) spectroscopy concerning isolated lattice vacancies …
The hyperfine spectrum associated with unpaired electrons at the (111) Si/Si02 interface (P b centers) is reported for the first time. Electron paramagnetic resonance measurements …
The defect structure of the Si/SiO 2 interface is increasingly important as the size of metal- oxide-semiconductor (MOS) integrated circuits shrinks into the submicron regime. Extensive …
Three new EPR spectra (Si− A 1 4,− A 1 5, and− A 16) and two previously known spectra (S i− P 2 and− P 4) are observed for the first time in electron-irradiated silicon. The microscopic …
This article shows that chains of optical or microwave emitters coupled to a one-dimensional (1D) waveguide support subradiant states with close pairs of excited emitters, which have …
An electron-paramagnetic-resonance (EPR) study dealing with the means for introducing substitutional N into silicon and the structure of N centers is presented in this paper. Nitrogen …