[HTML][HTML] A quantitative model for the bipolar amplification effect: A new method to determine semiconductor/oxide interface state densities

JP Ashton, SJ Moxim, AD Purcell… - Journal of Applied …, 2021 - pubs.aip.org
We report on a model for the bipolar amplification effect (BAE), which enables defect density
measurements utilizing BAE in metal–oxide–semiconductor field-effect transistors. BAE is an …

Electron spin resonance in P-doped Si nanocrystals/SiC stacked structures with various dot sizes

T Sun, D Li, J Chen, J Han, T Zhu, W Li, J Xu… - Applied Surface …, 2023 - Elsevier
Doping in semiconductor nanocrystals have a significant impact on electronic structures and
the relative studies are needed in order to deeply understand the doping effect in nanoscale …

Multiple-photon transitions in electrically detected magnetic resonance measurements of transistors

JP Ashton, PM Lenahan - Physical Review B, 2020 - APS
We report an ultralow-field frequency-swept electrically detected magnetic resonance
(fsEDMR) measurement scheme sensitive to so-called ultrastrong coupling in paramagnetic …

A Highly Efficient Annealing Process With Supercritical N2O at 120 °C for SiO2/4H–SiC Interface

M Wang, M Yang, W Liu, J Qi, S Yang… - … on Electron Devices, 2021 - ieeexplore.ieee.org
A novel post-oxidation annealing (POA) process with supercritical N 2 O (SCN 2 O) fluid is
reported to be highly effective in improving the interface properties of the SiO 2/4H-silicon …

[HTML][HTML] Ultra-low field frequency-swept electrically detected magnetic resonance

JP Ashton, BR Manning, WR Barker… - Journal of Applied …, 2021 - pubs.aip.org
We have developed a new ultra-low field frequency-swept (FS) electrically detected
magnetic resonance (EDMR) spectrometer to perform sensitive EDMR measurements of 4H …

Application of Pyroelectric Sensors Based on PVDF Films for EPR Spectra Detection by Heat Release

AR Melnikov, SB Zikirin, EV Kalneus, VI Ivannikov… - Sensors, 2021 - mdpi.com
Pyroelectrics are a wide class of materials that change their polarization when the system
temperature varies. This effect is utilized for a number of different commercial and industrial …

Leakage currents and E'centers in 4H-SiC MOSFETs with barium passivation

JP Ashton, PM Lenahan… - 2020 IEEE …, 2020 - ieeexplore.ieee.org
4H-SiC metal-oxide-semiconductor field-effect transistors have a substantially lower
effective channel mobility than silicon-based counterparts. Nitric oxide annealing has been …

Observation of Paramagnetic Recombination Centers in 4H-SiC pin Diodes via Electrically Detected Magnetic Resonance

A Purcell - 2023 - etda.libraries.psu.edu
The 4H-SiC polytype is arguably the most technologically relevant due to its relatively large
band-gap which give rise to its preferred application in high-power and high-temperature …

[PDF][PDF] Notes on interface traps in 4H-Silicon Carbide metal-oxide-semiconductor devices

RK Chanana - IOSR-J. Electrical and Electronics Engg, 2020 - academia.edu
Two observations and their analysis are performed in this short communication. One, the
bulk defects Z1/2 and EH5 in the 4H-SiC epitaxial layers manifest themselves as SiO2/4H …

Magnetic Field-Swept and Frequency-Swept Electrically Detected Magnetic Resonance Studies of 4H-SiC Metal-Oxide-Semiconductor Field-Effect Transistors

JP Ashton - 2020 - search.proquest.com
Abstract 4H-SiC metal-oxide-semiconductor field-effect transistors are promising for high
power and high temperature applications but suffer from a relatively low effective channel …