Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …
HA Pereira, K da Boit Martinello, Y Vieira, JC Diel… - Chemosphere, 2023 - Elsevier
The present work synthesized two new materials of functionalized multi-walled carbon nanotubes (MWCNT–OH and MWCNT–COOH) impregnated with magnetite (Fe 3 O 4) using …
Graphene is the strongest material ever studied and can be an efficient substitute for silicon. This six-volume handbook focuses on fabrication methods, nanostructure and atomic …
M Ishii - Journal of Physics: Condensed Matter, 2010 - iopscience.iop.org
This paper reviews charges that locally functionalize materials. Microscopic analyses and operation of charges using various scanning probe microscopy (SPM) techniques have …
We report the direct experimental observation of the semiconductor-metal transition in single- wall carbon nanotubes (SWNTs) induced by compression with the tip of an atomic force …
Graphene is the strongest material ever studied and in the future may be an efficient substitute for silicon. There is no other major reference work of this scope on the topic of …
M Rahimi, JK Singh… - The Journal of Physical …, 2015 - ACS Publications
The adsorption and orientational ordering of carbon dioxide molecules on parallel bundles of charged as well as uncharged carbon nanotubes were investigated at 300 K using grand …
A Verdaguer, M Cardellach, JJ Segura… - Applied Physics …, 2009 - pubs.aip.org
By means of scanning probe microscopy we are able to inject charges in isolated graphene sheets deposited on SiO 2/Si wafers and characterize the discharge induced by water in …
E Palleau, L Ressier, T Mélin - Nanotechnology, 2010 - iopscience.iop.org
Electrostatic nanopatterning of electret thin films by atomic force microscopy (AFM) has emerged as an alternative efficient tool for the directed assembly of nano-objects on …