Epitaxial silicon carbide on silicon. method of coordinated substitution of atoms (a review)

SA Kukushkin, AV Osipov - Russian Journal of General Chemistry, 2022 - Springer
A review of advances in the growth of SiC epitaxial films on silicon is presented. All the main
classical methods used at present to grow SiC films on silicon are described. Their …

Plasma assisted molecular beam epitaxy of thin GaN films on Si (111) and SiC/Si (111) substrates: Effect of SiC and polarity issues

SA Kukushkin, AM Mizerov, AV Osipov, AV Redkov… - Thin Solid Films, 2018 - Elsevier
The paper focuses on growth of GaN thin films via plasma assisted molecular beam epitaxy
on SiC/Si (111) substrate formed by atom-by-atom substitution method. A comparison with …

The mechanism of growth of GaN films by the HVPE method on SiC synthesized by the substitution of atoms on porous Si substrates

SA Kukushkin, SS Sharofidinov… - ECS Journal of Solid …, 2018 - iopscience.iop.org
The mechanisms of nucleation and growth of GaN films on porous silicon substrates with a
buffer layer of silicon carbide grown by new method of substitution of atoms directly in the …

[PDF][PDF] Growth of SiC films by the method of substitution of atoms on porous Si (100) and (111) substrates

VV Kidalov, SA Kukushkin, AV Osipov, AV Redkov… - 2018 - researchgate.net
The mechanisms of growth of silicon carbide (SiC) films by the method of substitution of
atoms on macro-and mesoporous silicon substrates (Si) of p-and n-type conduction are …

SiC/Si as a new platform for growth of wide-bandgap semiconductors

S Kukushkin, A Osipov, A Redkov - Mechanics and Control of Solids and …, 2022 - Springer
The review provides a short list of the latest scientific achievements of the Laboratory of
Structural and Phase Transformations in Condensed Matter, Institute for Problems in …

Structure and properties of Ta/Al/Ta and Ti/Al/Ti/Au multilayer metal stacks formed as ohmic contacts on n-GaN

I Boturchuk, T Walter, B Julsgaard, G Khatibi… - Journal of Materials …, 2019 - Springer
Formation of ohmic contacts to GaN is of high practical importance for device fabrication.
Due to the wide band gap, formation of multilayer metal structures is required to make …

Raman Microscopy and Imaging of Semiconductor Films Grown on SiC Hybrid Substrate Fabricated by the Method of Coordinated Substitution of Atoms on Silicon

TS Perova, SA Kukushkin… - Handbook of Silicon …, 2023 - taylorfrancis.com
The introduction to this chapter provides a brief overview of recent Raman imaging studies
of various SiC structures. These include bulk crystals, layers, composites and fibers, as well …

Structural characterization of movpe grown algan/gan for hemt formation

VN Popok, TS Aunsborg, RH Godiksen… - Reviews on Advanced …, 2018 - degruyter.com
Results on structural, compositional, optical and electrical characterization of MOVPE grown
AlGaN/GaN heterostructures with focus on understanding how the AlN buffer synthesis …

Учредители: Российская академия наук

СА КУКУШКИН, АВ ОСИПОВ - ЖУРНАЛ ОБЩЕЙ ХИМИИ, 2022 - elibrary.ru
Приведен обзор достижений в области роста эпитаксиальных пленок SiC на Si.
Описаны все основные классические методы выращивания пленок на SiC на Si …

[引用][C] STRUCTURAL CHARACTERIZATION OF MOVPE GROWN

VN Popok, TS Aunsborg, RH Godiksen, PK Kristensen…