Electron back scatter diffraction (EBSD) has made an impressive impact on the
characterization of materials by directly linking microstructure and crystallographic texture to …

In this paper we explore methods of measuring elastic strain variations in the presence of
larger lattice rotations (up to∼ 11°) using high resolution electron backscatter diffraction. We …

This completely revised and expanded new edition covers the full range of techniques now
available for the investigation of materials structure and accurate quantitative determination …

We imaged nanoscale lattice strain in a multilayer semiconductor device prototype with a
new X-ray technique, nanofocused Bragg projection ptychography. Applying this technique …

Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

Current high angular resolution electron backscatter diffraction (HR-EBSD) methods are
successful at measuring pure elastic strains but have difficulties with plastically deformed …

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in
angular resolution, as compared to'conventional'Hough transform based EBSD, of two …

We analyse the link between precision of pattern shift measurements and the resolution of
the measurement of elastic strain and lattice rotation using high resolution electron …

It is important to evaluate microscopic stress distributions on the order of the grain size to
clarify the deformation and fracture behavior of structural materials. In this study, the …

Determining the accuracy of elastic strain measurements in plastically deformed alloys is an
experimental challenge. To develop a novel cross-validation procedure, a controlled elasto …