The aim of this book is to outline the physics of image formation, electron specimen
interactions and image interpretation in transmission electron mic roscopy. The book …

Although scanning transmission electron microscopy (STEM) images of individual heavy
atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging …

The increasing need for precise determination of the atomic arrangement of non-periodic
structures in materials design and the control of nanostructures explains the growing interest …

The physical basis for using a probe-position integrated cross section (PICS) for a single
column of atoms as an effective way to compare simulation and experiment in high-angle …

We show that aberration-corrected scanning transmission electron microscopy operating at
low accelerating voltages is able to analyze, simultaneously and with single atom resolution …

Quantitative annular dark-field in the scanning transmission electron microscope (ADF
STEM), where image intensities are used to provide composition and thickness …

The new generation of energy-dispersive X-ray (EDX) detectors with higher count rates than
ever before, paves the way for a new approach to quantitative elemental analysis in the …

Quantitative annular dark field scanning transmission electron microscopy (ADF STEM) has
become a powerful technique to characterise nano-particles on an atomic scale. Because of …

Annular dark-field imaging in a scanning transmission electron microscope (STEM) is known
to enhance contrast of small supported particles of heavy elements. At high scattering …

We describe a technique for efficient, quantitative, standardless elemental mapping using a
high‐angle annular detector in a scanning transmission electron microscope (STEM) to …