Enhancing Data Integrity with Efficient Retention-Refilling Programming Schemes

KC Chiang, YC Li, WC Wang, WK Shih… - ACM SIGAPP Applied …, 2024 - dl.acm.org
The retention error has become one of the most challenging reliability issues of flash
memory due to the shrinking of the technology nodes. To enhance data integrity by resolving …

On Enhancing Data Integrity with Low-cost Retention-Refillable Programming Scheme

KC Chiang, YC Li, WC Wang, WK Shih - Proceedings of the 39th ACM …, 2024 - dl.acm.org
The retention error has become one of the most challenging reliability issues of flash
memory due to the shrinking of the technology nodes. To enhance data integrity by resolving …

Reaping Both Latency and Reliability Benefits With Elaborate Sanitization Design for 3D TLC NAND Flash

WC Wang, CC Ho, YC Li, LC Chen… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
With the rising security concern on modern storage systems, the concept of data sanitization
has been widely investigated recently. Among the existing works targeting data sanitization …

Toward instantaneous sanitization through disturbance-induced errors and recycling programming over 3D flash memory

WC Wang, PH Lin, YC Li, CC Ho… - 2019 IEEE/ACM …, 2019 - ieeexplore.ieee.org
As data security has become one of the most crucial issues in modern storage
system/application designs, the data sanitization techniques are regarded as the promising …